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X-ray diffraction study of spontaneous strain in superconducting Ba0.6 K0.4 BiO3
http://hdl.handle.net/2297/22579
http://hdl.handle.net/2297/225794e704f88-1147-4b12-9c90-f8f5b626e9fc
名前 / ファイル | ライセンス | アクション |
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SC-PR-FUJISHITA-H-711_.pdf (260.1 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2017-10-03 | |||||
タイトル | ||||||
タイトル | X-ray diffraction study of spontaneous strain in superconducting Ba0.6 K0.4 BiO3 | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Fujishita, Hideshi
× Fujishita, Hideshi× Yamada, T.× Nakada, S.× Okamoto, H.× Shitara, Seigo× Kato, M.× Koike, Y. |
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提供者所属 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 金沢大学理工研究域数物科学系 | |||||
書誌情報 |
Solid State Communications 巻 150, 号 15-16, p. 711-714, 発行日 2010-04-01 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0038-1098 | |||||
NCID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00844573 | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1016/j.ssc.2010.01.040 | |||||
出版者 | ||||||
出版者 | Elsevier | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | The lattice parameter of Ba0.6 K0.4 BiO3, which is a well-studied conventional superconductor, was measured by the X-ray Rietveld method between 10 K and room temperature. A very small change in the lattice parameter could be detected in the superconducting phase. The change could be attributed to a spontaneous strain generated in the superconducting phase by the coupling between a superconducting order parameter and the strain. Previously published data on Y Ba2 Cu3 O6.5 and MgB2 were analyzed, and the present results were compared with our previously obtained results on La1.85 Sr0.15 CuO4. It was concluded that this coupling phenomenon is common to all superconductors. © 2010 Elsevier Ltd. All rights reserved. | |||||
著者版フラグ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
関連URI | ||||||
識別子タイプ | URI | |||||
関連識別子 | http://www.elsevier.com/locate/issn/00381098 |