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Bi偏析によるCu双結晶粒界のぜい化
http://hdl.handle.net/2297/12435
http://hdl.handle.net/2297/124359004f5b2-1972-4c6b-86b0-050436f6ee7a
名前 / ファイル | ライセンス | アクション |
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TE-PR-MONZEN-R-398.pdf (986.0 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2017-10-03 | |||||
タイトル | ||||||
タイトル | Bi偏析によるCu双結晶粒界のぜい化 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Embrittlement of Grain Boundaries in Cu Bicrystals Induced by Bi Segregation | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
門前, 亮一
× 門前, 亮一× 岡本, 智宏× 久世, 卓矢× 三浦, 博己 |
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提供者所属 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 金沢大学理工研究域機械工学系 | |||||
書誌情報 |
材料 巻 48, 号 4, p. 398-402, 発行日 1999-04-15 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0514-5163 | |||||
NCID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AN00096175 | |||||
出版者 | ||||||
出版者 | 日本材料学会 | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Bi-doped Cu bicrystals with various[001]and[011]twist boundaries have been tensile tested at room temperature and 543K. The fracture stress and fracture strain depend strongly on the misorientation angle and tensile temperature. The difference in the degree of embrittlement among different grain boundaries is more significant at 543K. The fracture stress and fracture strain at 543K against misorientation curves display some clear peaks ; θ=23°(Σ13A), 28°(Σ17A), 37°(Σ5)and 44°(Σ29A)for[001]boundaries and θ=50°(Σ11), 59°(Σ33C), 71°(Σ3)and 83°(Σ57B)for[011]boundaries. For the two types of grain boundary, a good correlation is found between the degree of embrittlement and grain-boundary energy. A higher-energy boundary is more brittle and fractures more easily with a lower tensile stress. The fracture stresses of[001]boundaries are greater than those of[011]boundaries. | |||||
権利 | ||||||
権利情報 | 日本材料学会;本文データは日本材料学会の許諾に基づきCiNiiから複製したものである | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
関連URI | ||||||
識別子タイプ | URI | |||||
関連識別子 | http://ci.nii.ac.jp/naid/110002293753/ |