WEKO3
インデックスリンク
アイテム
{"_buckets": {"deposit": "66e79a78-350f-4081-8c19-867c082a8381"}, "_deposit": {"created_by": 3, "id": "9499", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "9499"}, "status": "published"}, "_oai": {"id": "oai:kanazawa-u.repo.nii.ac.jp:00009499", "sets": ["936"]}, "author_link": ["11069", "13709", "13711", "13710"], "item_4_biblio_info_8": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2001-07-01", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "4", "bibliographicPageEnd": "2793", "bibliographicPageStart": "2790", "bibliographicVolumeNumber": "37", "bibliographic_titles": [{"bibliographic_title": "IEEE Transactions on Maggetics"}]}]}, "item_4_description_21": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "This paper presents a wavelet-based image processing technique, which analyzes eddy-current testing (ECT) images derived by scanning printed circuit boards (PCB\u0027s) with an ECT probe and automatically detects the existence and location of the defect. First, the undesired components contained in probe output are removed through two types of wavelet filtering. Then the comparison of two images obtained from reference and tested PCB\u0027s are carried out to extract the signal due to the defect. In this paper, one-dimensional (1-D) wavelet is used only in the horizontal direction considering that the scanning of the probe is along that direction. In addition, the square norm of difference between original and processed signal is proposed as a criterion to keep the waveform of the defect peak as possible. The application examples of sample PCB\u0027s reveal the effectiveness and problems of the given approach.", "subitem_description_type": "Abstract"}]}, "item_4_publisher_17": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Institute of Electrical and Electronics Engineers IEEE"}]}, "item_4_relation_12": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isIdenticalTo", "subitem_relation_type_id": {"subitem_relation_type_id_text": "10.1109/20.951308", "subitem_relation_type_select": "DOI"}}]}, "item_4_source_id_11": {"attribute_name": "NCID", "attribute_value_mlt": [{"subitem_source_identifier": "AA00667933", "subitem_source_identifier_type": "NCID"}]}, "item_4_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0018-9464", "subitem_source_identifier_type": "ISSN"}]}, "item_4_version_type_25": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Taniguchi, T."}], "nameIdentifiers": [{"nameIdentifier": "13709", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Kacprzak, D."}], "nameIdentifiers": [{"nameIdentifier": "13710", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yamada, Sotoshi"}], "nameIdentifiers": [{"nameIdentifier": "11069", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "80019786", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://kaken.nii.ac.jp/ja/search/?qm=80019786"}, {"nameIdentifier": "80019786", "nameIdentifierScheme": "研究者番号", "nameIdentifierURI": "https://nrid.nii.ac.jp/nrid/1000080019786"}]}, {"creatorNames": [{"creatorName": "Iwahara, Masayoshi"}], "nameIdentifiers": [{"nameIdentifier": "13711", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "80020212", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://kaken.nii.ac.jp/ja/search/?qm=80020212"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2017-10-03"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "TE-PR-YAMADA-S-184.pdf", "filesize": [{"value": "431.7 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 431700.0, "url": {"label": "TE-PR-YAMADA-S-184.pdf", "url": "https://kanazawa-u.repo.nii.ac.jp/record/9499/files/TE-PR-YAMADA-S-184.pdf"}, "version_id": "863f3c45-7dc5-4ae0-9e1e-bc1b8afcdcc5"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "Eddy-Current testing (ECT)", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Printed circuit board (PCB)", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Wavelet transform", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Wavelet-Based Processing of ECT Images for Inspection of Printed Circuit Board", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Wavelet-Based Processing of ECT Images for Inspection of Printed Circuit Board"}]}, "item_type_id": "4", "owner": "3", "path": ["936"], "permalink_uri": "http://hdl.handle.net/2297/48308", "pubdate": {"attribute_name": "公開日", "attribute_value": "2017-10-03"}, "publish_date": "2017-10-03", "publish_status": "0", "recid": "9499", "relation": {}, "relation_version_is_last": true, "title": ["Wavelet-Based Processing of ECT Images for Inspection of Printed Circuit Board"], "weko_shared_id": -1}
Wavelet-Based Processing of ECT Images for Inspection of Printed Circuit Board
http://hdl.handle.net/2297/48308
http://hdl.handle.net/2297/48308f191d2bd-d554-406c-b935-76c9e382d4d3
名前 / ファイル | ライセンス | アクション |
---|---|---|
TE-PR-YAMADA-S-184.pdf (431.7 kB)
|
|
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2017-10-03 | |||||
タイトル | ||||||
タイトル | Wavelet-Based Processing of ECT Images for Inspection of Printed Circuit Board | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Taniguchi, T.
× Taniguchi, T.× Kacprzak, D.× Yamada, Sotoshi× Iwahara, Masayoshi |
|||||
書誌情報 |
IEEE Transactions on Maggetics 巻 37, 号 4, p. 2790-2793, 発行日 2001-07-01 |
|||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0018-9464 | |||||
NCID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00667933 | |||||
DOI | ||||||
関連タイプ | isIdenticalTo | |||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1109/20.951308 | |||||
出版者 | ||||||
出版者 | Institute of Electrical and Electronics Engineers IEEE | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | This paper presents a wavelet-based image processing technique, which analyzes eddy-current testing (ECT) images derived by scanning printed circuit boards (PCB's) with an ECT probe and automatically detects the existence and location of the defect. First, the undesired components contained in probe output are removed through two types of wavelet filtering. Then the comparison of two images obtained from reference and tested PCB's are carried out to extract the signal due to the defect. In this paper, one-dimensional (1-D) wavelet is used only in the horizontal direction considering that the scanning of the probe is along that direction. In addition, the square norm of difference between original and processed signal is proposed as a criterion to keep the waveform of the defect peak as possible. The application examples of sample PCB's reveal the effectiveness and problems of the given approach. | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 |