Institute of Electrical and Electronics Engineers IEEE
抄録
This paper presents results pertaining to image data obtained from a planar meander-mesh coupled coil type ECT probe. The image data makes it possible to detect not only the existence of a defect but also to extract detailed information regarding the nature of the defect, such as its position, shape, length, and direction. In order to recognize a defect distinctly, we have fabricated the high sensitive planar coil which can be used to image a 2-D representation of the ECT signal. The relationships between the image pattern and defect shape are discussed.
Defect Images by Planar ECT Probe of Meander-Mesh Coils
TE-PR-YAMADA-S-099.pdf
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