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{"_buckets": {"deposit": "e16ab2bc-985e-40e5-9440-bb8d72e915d0"}, "_deposit": {"created_by": 3, "id": "10343", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "10343"}, "status": "published"}, "_oai": {"id": "oai:kanazawa-u.repo.nii.ac.jp:00010343", "sets": ["937"]}, "author_link": ["15587", "15584", "15585", "15586"], "item_4_biblio_info_8": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2010-11-01", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "6", "bibliographicPageEnd": "1283", "bibliographicPageStart": "1279", "bibliographicVolumeNumber": "28", "bibliographic_titles": [{"bibliographic_title": "Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures"}]}]}, "item_4_description_21": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "Three types of tips for noncontact atomic force microscopy imaging, namely, a silicon nanopillar tip, a carbon nanopillar tip, and a fluoride cluster tip, are prepared for atomic resolution imaging on the CaF2 (111) surface. The most enhanced atomic corrugation is obtained with the fluoride cluster tip prepared by gently touching the fluorite surface. Atom resolved images are much harder to obtain with the other tips. This demonstrates the importance of having a polar tip for atomic resolution imaging of an ionic surface and supports the general notion that a surface is best imaged with a tip of the same material. © 2010 American Vacuum Society.", "subitem_description_type": "Abstract"}]}, "item_4_description_5": {"attribute_name": "提供者所属", "attribute_value_mlt": [{"subitem_description": "金沢大学理工研究域数物科学系", "subitem_description_type": "Other"}]}, "item_4_publisher_17": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "American Vacuum Society"}]}, "item_4_relation_12": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "10.1116/1.3511505", "subitem_relation_type_select": "DOI"}}]}, "item_4_source_id_11": {"attribute_name": "NCID", "attribute_value_mlt": [{"subitem_source_identifier": "AA10804928", "subitem_source_identifier_type": "NCID"}]}, "item_4_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "1071-1023", "subitem_source_identifier_type": "ISSN"}]}, "item_4_version_type_25": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_ab4af688f83e57aa", "subitem_version_type": "AM"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Arai, Toyoko"}], "nameIdentifiers": [{"nameIdentifier": "15584", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "20250235", "nameIdentifierScheme": "金沢大学研究者情報", "nameIdentifierURI": "http://ridb.kanazawa-u.ac.jp/public/detail.php?kaken=20250235"}, {"nameIdentifier": "20250235", "nameIdentifierScheme": "研究者番号", "nameIdentifierURI": "https://nrid.nii.ac.jp/nrid/1000020250235"}]}, {"creatorNames": [{"creatorName": "Gritschneder, S."}], "nameIdentifiers": [{"nameIdentifier": "15585", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Tröger, L."}], "nameIdentifiers": [{"nameIdentifier": "15586", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Reichling, M."}], "nameIdentifiers": [{"nameIdentifier": "15587", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2017-10-03"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "SC-PR-ARAI-T-1279.pdf", "filesize": [{"value": "793.0 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 793000.0, "url": {"label": "SC-PR-ARAI-T-1279.pdf", "url": "https://kanazawa-u.repo.nii.ac.jp/record/10343/files/SC-PR-ARAI-T-1279.pdf"}, "version_id": "2aa19bc8-a265-41fa-ac5b-87386e838a4d"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tips", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tips"}]}, "item_type_id": "4", "owner": "3", "path": ["937"], "permalink_uri": "http://hdl.handle.net/2297/26229", "pubdate": {"attribute_name": "公開日", "attribute_value": "2017-10-03"}, "publish_date": "2017-10-03", "publish_status": "0", "recid": "10343", "relation": {}, "relation_version_is_last": true, "title": ["Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tips"], "weko_shared_id": -1}
Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tips
http://hdl.handle.net/2297/26229
http://hdl.handle.net/2297/262293d095f29-eb28-4bef-be40-edb15ade7f77
名前 / ファイル | ライセンス | アクション |
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SC-PR-ARAI-T-1279.pdf (793.0 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2017-10-03 | |||||
タイトル | ||||||
タイトル | Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tips | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Arai, Toyoko
× Arai, Toyoko× Gritschneder, S.× Tröger, L.× Reichling, M. |
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提供者所属 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 金沢大学理工研究域数物科学系 | |||||
書誌情報 |
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 巻 28, 号 6, p. 1279-1283, 発行日 2010-11-01 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1071-1023 | |||||
NCID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA10804928 | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1116/1.3511505 | |||||
出版者 | ||||||
出版者 | American Vacuum Society | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Three types of tips for noncontact atomic force microscopy imaging, namely, a silicon nanopillar tip, a carbon nanopillar tip, and a fluoride cluster tip, are prepared for atomic resolution imaging on the CaF2 (111) surface. The most enhanced atomic corrugation is obtained with the fluoride cluster tip prepared by gently touching the fluorite surface. Atom resolved images are much harder to obtain with the other tips. This demonstrates the importance of having a polar tip for atomic resolution imaging of an ionic surface and supports the general notion that a surface is best imaged with a tip of the same material. © 2010 American Vacuum Society. | |||||
著者版フラグ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa |