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{"_buckets": {"deposit": "74f38784-92ad-4e59-9476-967cf5b928bb"}, "_deposit": {"created_by": 3, "id": "29299", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "29299"}, "status": "published"}, "_oai": {"id": "oai:kanazawa-u.repo.nii.ac.jp:00029299", "sets": ["1981"]}, "author_link": ["11069", "50291", "50292", "11068"], "item_4_biblio_info_8": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1996-01-01", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "5", "bibliographicPageEnd": "4958", "bibliographicPageStart": "4956", "bibliographicVolumeNumber": "32", "bibliographic_titles": [{"bibliographic_title": "IEEE Transactions on Magnetics"}]}]}, "item_4_description_21": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "This paper presents results pertaining to image data obtained from a planar meander-mesh coupled coil type ECT probe. The image data makes it possible to detect not only the existence of a defect but also to extract detailed information regarding the nature of the defect, such as its position, shape, length, and direction. In order to recognize a defect distinctly, we have fabricated the high sensitive planar coil which can be used to image a 2-D representation of the ECT signal. The relationships between the image pattern and defect shape are discussed. © 1996 IEEE.", "subitem_description_type": "Abstract"}]}, "item_4_description_5": {"attribute_name": "提供者所属", "attribute_value_mlt": [{"subitem_description": "金沢大学環日本海域環境研究センター生体機能計測研究部門", "subitem_description_type": "Other"}]}, "item_4_publisher_17": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "IEEE"}]}, "item_4_relation_12": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isIdenticalTo", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1109/20.539300", "subitem_relation_type_select": "DOI"}}]}, "item_4_rights_23": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "© IEEE 1996"}]}, "item_4_source_id_11": {"attribute_name": "NCID", "attribute_value_mlt": [{"subitem_source_identifier": "AA00667933", "subitem_source_identifier_type": "NCID"}]}, "item_4_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0018-9464", "subitem_source_identifier_type": "ISSN"}]}, "item_4_version_type_25": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Yamada, Sotoshi"}], "nameIdentifiers": [{"nameIdentifier": "11069", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "80019786", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://kaken.nii.ac.jp/ja/search/?qm=80019786"}, {"nameIdentifier": "80019786", "nameIdentifierScheme": "研究者番号", "nameIdentifierURI": "https://nrid.nii.ac.jp/nrid/1000080019786"}]}, {"creatorNames": [{"creatorName": "Katou, Masaki"}], "nameIdentifiers": [{"nameIdentifier": "50291", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Iwahara, Masayoshi"}], "nameIdentifiers": [{"nameIdentifier": "11068", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "80020212", "nameIdentifierScheme": "研究者番号", "nameIdentifierURI": "https://nrid.nii.ac.jp/nrid/1000080020212"}]}, {"creatorNames": [{"creatorName": "Dawson, Francis P."}], "nameIdentifiers": [{"nameIdentifier": "50292", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2017-10-05"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "TE-PR-YAMADA-S-03.pdf", "filesize": [{"value": "346.4 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 346400.0, "url": {"label": "TE-PR-YAMADA-S-03.pdf", "url": "https://kanazawa-u.repo.nii.ac.jp/record/29299/files/TE-PR-YAMADA-S-03.pdf"}, "version_id": "efccfc38-d9ef-4d74-85b4-1b485a86db4c"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Defect images by planar ect probe of meader-mesh coils", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Defect images by planar ect probe of meader-mesh coils"}]}, "item_type_id": "4", "owner": "3", "path": ["1981"], "permalink_uri": "http://hdl.handle.net/2297/6899", "pubdate": {"attribute_name": "公開日", "attribute_value": "2017-10-05"}, "publish_date": "2017-10-05", "publish_status": "0", "recid": "29299", "relation": {}, "relation_version_is_last": true, "title": ["Defect images by planar ect probe of meader-mesh coils"], "weko_shared_id": 3}
Defect images by planar ect probe of meader-mesh coils
http://hdl.handle.net/2297/6899
http://hdl.handle.net/2297/6899ff2d0694-12ed-456b-b876-ee6813c1beea
名前 / ファイル | ライセンス | アクション |
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TE-PR-YAMADA-S-03.pdf (346.4 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2017-10-05 | |||||
タイトル | ||||||
タイトル | Defect images by planar ect probe of meader-mesh coils | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Yamada, Sotoshi
× Yamada, Sotoshi× Katou, Masaki× Iwahara, Masayoshi× Dawson, Francis P. |
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提供者所属 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 金沢大学環日本海域環境研究センター生体機能計測研究部門 | |||||
書誌情報 |
IEEE Transactions on Magnetics 巻 32, 号 5, p. 4956-4958, 発行日 1996-01-01 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0018-9464 | |||||
NCID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00667933 | |||||
DOI | ||||||
関連タイプ | isIdenticalTo | |||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1109/20.539300 | |||||
出版者 | ||||||
出版者 | IEEE | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | This paper presents results pertaining to image data obtained from a planar meander-mesh coupled coil type ECT probe. The image data makes it possible to detect not only the existence of a defect but also to extract detailed information regarding the nature of the defect, such as its position, shape, length, and direction. In order to recognize a defect distinctly, we have fabricated the high sensitive planar coil which can be used to image a 2-D representation of the ECT signal. The relationships between the image pattern and defect shape are discussed. © 1996 IEEE. | |||||
権利 | ||||||
権利情報 | © IEEE 1996 | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 |