WEKO3
インデックスリンク
アイテム
{"_buckets": {"deposit": "5a9d81d8-61c5-48fd-94ec-3a62f1e290f5"}, "_deposit": {"created_by": 18, "id": "42860", "owners": [18], "pid": {"revision_id": 0, "type": "depid", "value": "42860"}, "status": "published"}, "_oai": {"id": "oai:kanazawa-u.repo.nii.ac.jp:00042860", "sets": ["936"]}, "author_link": ["68534", "68536", "13678", "68535", "73485"], "item_4_biblio_info_8": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2001", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "1-4 SPEC", "bibliographicPageEnd": "19", "bibliographicPageStart": "15", "bibliographicVolumeNumber": "15", "bibliographic_titles": [{"bibliographic_title": "International Journal of Applied Electromagnetics and Mechanics"}]}]}, "item_4_creator_33": {"attribute_name": "著者別表示", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "山田, 外史"}], "nameIdentifiers": [{"nameIdentifier": "68535", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "岩原, 正吉"}], "nameIdentifiers": [{"nameIdentifier": "68536", "nameIdentifierScheme": "WEKO"}]}]}, "item_4_description_21": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "This paper presents simulated amplitude and phase characteristics obtained during the inspection of printed circuit board by an eddy-current testing probe. The simulation is based on the \"two-components\" nature of the output signal. Amplitude and phase characteristics, obtained during the experimental inspection and simulation, are presented.", "subitem_description_type": "Abstract"}]}, "item_4_identifier_registration": {"attribute_name": "ID登録", "attribute_value_mlt": [{"subitem_identifier_reg_text": "10.24517/00049209", "subitem_identifier_reg_type": "JaLC"}]}, "item_4_publisher_17": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "The Japan Society of Applied Electromagnetics and Mechanics (JSAEM) = 日本AEM学会"}]}, "item_4_relation_28": {"attribute_name": "関連URI", "attribute_value_mlt": [{"subitem_relation_name": [{"subitem_relation_name_text": "http://www.jsaem.gr.jp/"}], "subitem_relation_type_id": {"subitem_relation_type_id_text": "http://www.jsaem.gr.jp/", "subitem_relation_type_select": "URI"}}]}, "item_4_rights_23": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright © The Japan Society of Applied Electromagnetics and Mechanics (JSAEM) 日本AEM学会"}]}, "item_4_source_id_11": {"attribute_name": "NCID", "attribute_value_mlt": [{"subitem_source_identifier": "AA11051133", "subitem_source_identifier_type": "NCID"}]}, "item_4_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "1383-5416", "subitem_source_identifier_type": "ISSN"}]}, "item_4_version_type_25": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Kacprzak, D."}], "nameIdentifiers": [{"nameIdentifier": "73485", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yamada, Sotoshi"}], "nameIdentifiers": [{"nameIdentifier": "13678", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "80019786", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://kaken.nii.ac.jp/ja/search/?qm=80019786"}]}, {"creatorNames": [{"creatorName": "Iwahara, Masayoshi"}], "nameIdentifiers": [{"nameIdentifier": "68534", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "80020212", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://kaken.nii.ac.jp/ja/search/?qm=80020212"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2017-12-07"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "TE-PR-YAMADA-S-202.pdf", "filesize": [{"value": "409.5 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_6", "mimetype": "application/pdf", "size": 409500.0, "url": {"label": "TE-PR-YAMADA-S-202.pdf", "url": "https://kanazawa-u.repo.nii.ac.jp/record/42860/files/TE-PR-YAMADA-S-202.pdf"}, "version_id": "55c8d5ff-3c1c-4533-99eb-0817a89905c5"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "Computer simulation", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Defects", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Eddy current testing", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Electric conductors", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Energy gap", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Inspection", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Phase characteristics", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Simulated amplitude", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Printed circuit boards", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Simulation of amplitude and phase characteristics during inspection of printed circuit board by eddy-current testing probe", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Simulation of amplitude and phase characteristics during inspection of printed circuit board by eddy-current testing probe"}]}, "item_type_id": "4", "owner": "18", "path": ["936"], "permalink_uri": "https://doi.org/10.24517/00049209", "pubdate": {"attribute_name": "公開日", "attribute_value": "2017-12-07"}, "publish_date": "2017-12-07", "publish_status": "0", "recid": "42860", "relation": {}, "relation_version_is_last": true, "title": ["Simulation of amplitude and phase characteristics during inspection of printed circuit board by eddy-current testing probe"], "weko_shared_id": -1}
Simulation of amplitude and phase characteristics during inspection of printed circuit board by eddy-current testing probe
https://doi.org/10.24517/00049209
https://doi.org/10.24517/00049209c71fc789-1813-4fbf-9bc0-9d291a5b490d
名前 / ファイル | ライセンス | アクション |
---|---|---|
TE-PR-YAMADA-S-202.pdf (409.5 kB)
|
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2017-12-07 | |||||
タイトル | ||||||
タイトル | Simulation of amplitude and phase characteristics during inspection of printed circuit board by eddy-current testing probe | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
ID登録 | ||||||
ID登録 | 10.24517/00049209 | |||||
ID登録タイプ | JaLC | |||||
著者 |
Kacprzak, D.
× Kacprzak, D.× Yamada, Sotoshi× Iwahara, Masayoshi |
|||||
著者別表示 |
山田, 外史
× 山田, 外史× 岩原, 正吉 |
|||||
書誌情報 |
International Journal of Applied Electromagnetics and Mechanics 巻 15, 号 1-4 SPEC, p. 15-19, 発行日 2001 |
|||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1383-5416 | |||||
NCID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA11051133 | |||||
出版者 | ||||||
出版者 | The Japan Society of Applied Electromagnetics and Mechanics (JSAEM) = 日本AEM学会 | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | This paper presents simulated amplitude and phase characteristics obtained during the inspection of printed circuit board by an eddy-current testing probe. The simulation is based on the "two-components" nature of the output signal. Amplitude and phase characteristics, obtained during the experimental inspection and simulation, are presented. | |||||
権利 | ||||||
権利情報 | Copyright © The Japan Society of Applied Electromagnetics and Mechanics (JSAEM) 日本AEM学会 | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
関連URI | ||||||
識別子タイプ | URI | |||||
関連識別子 | http://www.jsaem.gr.jp/ | |||||
関連名称 | http://www.jsaem.gr.jp/ |