WEKO3
インデックスリンク
アイテム
{"_buckets": {"deposit": "d47f4307-adbc-45f5-aa0c-cc1d389d0e7b"}, "_deposit": {"created_by": 3, "id": "9497", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "9497"}, "status": "published"}, "_oai": {"id": "oai:kanazawa-u.repo.nii.ac.jp:00009497", "sets": ["936"]}, "author_link": ["13706", "11069", "13704", "13705", "11068"], "item_4_biblio_info_8": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2001-07-01", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "4", "bibliographicPageEnd": "2012", "bibliographicPageStart": "2010", "bibliographicVolumeNumber": "37", "bibliographic_titles": [{"bibliographic_title": "IEEE Transactions on Maggetics"}]}]}, "item_4_description_21": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "This paper presents a novel eddy-current testing (ECT) sensor for the inspection of printed circuit board (PCB), which detects trace damages on PCB conductors. The sensor is composed of a meander-exciting coil and three solenoid pick-up coils. Application of three pick-up coils increases the speed of the inspection process. Information about defects can be extracted either from an amplitude or a phase of a signal obtained during the inspection. A visualization process was provided using the amplitude data. In this paper the structure of the ECT sensor and principles of detection as well as experimental results are presented.", "subitem_description_type": "Abstract"}]}, "item_4_publisher_17": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Institute of Electrical and Electronics Engineers IEEE"}]}, "item_4_relation_12": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isIdenticalTo", "subitem_relation_type_id": {"subitem_relation_type_id_text": "10.1109/20.951037", "subitem_relation_type_select": "DOI"}}]}, "item_4_source_id_11": {"attribute_name": "NCID", "attribute_value_mlt": [{"subitem_source_identifier": "AA00667933", "subitem_source_identifier_type": "NCID"}]}, "item_4_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0018-9464", "subitem_source_identifier_type": "ISSN"}]}, "item_4_version_type_25": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Kacprzak, D."}], "nameIdentifiers": [{"nameIdentifier": "13704", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Taniguchi, T."}], "nameIdentifiers": [{"nameIdentifier": "13705", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Nakamura, N."}], "nameIdentifiers": [{"nameIdentifier": "13706", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Yamada, Sotoshi"}], "nameIdentifiers": [{"nameIdentifier": "11069", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "80019786", "nameIdentifierScheme": "e-Rad", "nameIdentifierURI": "https://kaken.nii.ac.jp/ja/search/?qm=80019786"}, {"nameIdentifier": "80019786", "nameIdentifierScheme": "研究者番号", "nameIdentifierURI": "https://nrid.nii.ac.jp/nrid/1000080019786"}]}, {"creatorNames": [{"creatorName": "Iwahara, Masayoshi"}], "nameIdentifiers": [{"nameIdentifier": "11068", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "80020212", "nameIdentifierScheme": "研究者番号", "nameIdentifierURI": "https://nrid.nii.ac.jp/nrid/1000080020212"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2017-10-03"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "TE-PR-YAMADA-S-182.pdf", "filesize": [{"value": "234.8 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 234800.0, "url": {"label": "TE-PR-YAMADA-S-182.pdf", "url": "https://kanazawa-u.repo.nii.ac.jp/record/9497/files/TE-PR-YAMADA-S-182.pdf"}, "version_id": "72c211d6-26f1-489c-8c48-062eb64270fc"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "Defect", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Meander coil", "subitem_subject_scheme": "Other"}, {"subitem_subject": "PCB", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Sensor", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Solenoid coil", "subitem_subject_scheme": "Other"}, {"subitem_subject": "Testing", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Novel Eddy Current Testing Sensor for the Inspection of Printed Circuit Boards", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Novel Eddy Current Testing Sensor for the Inspection of Printed Circuit Boards"}]}, "item_type_id": "4", "owner": "3", "path": ["936"], "permalink_uri": "http://hdl.handle.net/2297/48296", "pubdate": {"attribute_name": "公開日", "attribute_value": "2017-10-03"}, "publish_date": "2017-10-03", "publish_status": "0", "recid": "9497", "relation": {}, "relation_version_is_last": true, "title": ["Novel Eddy Current Testing Sensor for the Inspection of Printed Circuit Boards"], "weko_shared_id": -1}
Novel Eddy Current Testing Sensor for the Inspection of Printed Circuit Boards
http://hdl.handle.net/2297/48296
http://hdl.handle.net/2297/482962d3093c1-2ad0-4d5d-b852-a93c8782075d
名前 / ファイル | ライセンス | アクション |
---|---|---|
TE-PR-YAMADA-S-182.pdf (234.8 kB)
|
|
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2017-10-03 | |||||
タイトル | ||||||
タイトル | Novel Eddy Current Testing Sensor for the Inspection of Printed Circuit Boards | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Kacprzak, D.
× Kacprzak, D.× Taniguchi, T.× Nakamura, N.× Yamada, Sotoshi× Iwahara, Masayoshi |
|||||
書誌情報 |
IEEE Transactions on Maggetics 巻 37, 号 4, p. 2010-2012, 発行日 2001-07-01 |
|||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0018-9464 | |||||
NCID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00667933 | |||||
DOI | ||||||
関連タイプ | isIdenticalTo | |||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1109/20.951037 | |||||
出版者 | ||||||
出版者 | Institute of Electrical and Electronics Engineers IEEE | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | This paper presents a novel eddy-current testing (ECT) sensor for the inspection of printed circuit board (PCB), which detects trace damages on PCB conductors. The sensor is composed of a meander-exciting coil and three solenoid pick-up coils. Application of three pick-up coils increases the speed of the inspection process. Information about defects can be extracted either from an amplitude or a phase of a signal obtained during the inspection. A visualization process was provided using the amplitude data. In this paper the structure of the ECT sensor and principles of detection as well as experimental results are presented. | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 |