@article{oai:kanazawa-u.repo.nii.ac.jp:00010150,
 author = {Xue, Yun and Naher, Shumsun and Hata, Fumiaki and Kaneko, Hiroshi and Suzuki, Haruhiko and Kino, Yoshihiro},
 journal = {Journal of Low Temperature Physics},
 month = {Jan},
 note = {Results of x-ray diffraction measurements are presented for ZnCr2O4 and Ni0.5Zn0.5Cr2O4. Splits of the x-ray diffraction spectrum are observed in ZnCr2O4 at 12 K. In Ni0.5Zn0.5Cr2O4 no clear split is observed, but a full width at half maximum (FWHM) shows a steep increase below about 20 K. It is found that the integrated intensity of the diffraction spectra shows a softening behavior at low temperatures in ZnCr2O4. © 2008 Springer Science+Business Media, LLC., 金沢大学大学院自然科学研究科},
 pages = {1193--1204},
 title = {Low Temperature X-ray Diffraction Study of ZnCr2O4 and Ni0.5Zn0.5Cr2O4},
 volume = {151},
 year = {2008}
}