{"created":"2023-07-27T06:26:26.290173+00:00","id":10150,"links":{},"metadata":{"_buckets":{"deposit":"528ea4bc-fada-4b96-8711-23a9cbd8c0a8"},"_deposit":{"created_by":3,"id":"10150","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"10150"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00010150","sets":["934:935:937"]},"author_link":["15099","15094","15095","15097","15098","15096"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-01-01","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"1204","bibliographicPageStart":"1193","bibliographicVolumeNumber":"151","bibliographic_titles":[{"bibliographic_title":"Journal of Low Temperature Physics"}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Results of x-ray diffraction measurements are presented for ZnCr2O4 and Ni0.5Zn0.5Cr2O4. Splits of the x-ray diffraction spectrum are observed in ZnCr2O4 at 12 K. In Ni0.5Zn0.5Cr2O4 no clear split is observed, but a full width at half maximum (FWHM) shows a steep increase below about 20 K. It is found that the integrated intensity of the diffraction spectra shows a softening behavior at low temperatures in ZnCr2O4. © 2008 Springer Science+Business Media, LLC.","subitem_description_type":"Abstract"}]},"item_4_description_5":{"attribute_name":"提供者所属","attribute_value_mlt":[{"subitem_description":"金沢大学大学院自然科学研究科","subitem_description_type":"Other"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Springer Verlag (Germany)"}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1007/s10909-008-9796-4","subitem_relation_type_select":"DOI"}}]},"item_4_source_id_11":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA00701270","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0022-2291","subitem_source_identifier_type":"ISSN"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Xue, Yun"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Naher, Shumsun"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hata, Fumiaki"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kaneko, Hiroshi"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Suzuki, Haruhiko"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Kino, Yoshihiro"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-10-03"}],"displaytype":"detail","filename":"SC-PR-SUZUKI-H-2008.pdf","filesize":[{"value":"901.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"SC-PR-SUZUKI-H-2008.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/10150/files/SC-PR-SUZUKI-H-2008.pdf"},"version_id":"b8136182-bb89-4b2c-bd72-26acbda0257f"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Low Temperature X-ray Diffraction Study of ZnCr2O4 and Ni0.5Zn0.5Cr2O4","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Low Temperature X-ray Diffraction Study of ZnCr2O4 and Ni0.5Zn0.5Cr2O4"}]},"item_type_id":"4","owner":"3","path":["937"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-10-03"},"publish_date":"2017-10-03","publish_status":"0","recid":"10150","relation_version_is_last":true,"title":["Low Temperature X-ray Diffraction Study of ZnCr2O4 and Ni0.5Zn0.5Cr2O4"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-07-28T01:43:09.923216+00:00"}