{"created":"2023-07-27T06:26:26.375202+00:00","id":10152,"links":{},"metadata":{"_buckets":{"deposit":"c5598ff5-0bd4-4b93-932e-e09c7132ec5b"},"_deposit":{"created_by":3,"id":"10152","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"10152"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00010152","sets":["4161:3020:3021"]},"author_link":["15100","13404","2327","15101","2361"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-05-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5","bibliographicPageEnd":"053708-5","bibliographicPageStart":"053708-1","bibliographicVolumeNumber":"76","bibliographic_titles":[{"bibliographic_title":"Review of Scientific Instruments"}]}]},"item_4_creator_33":{"attribute_name":"著者別表示","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"古寺, 哲幸"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"安藤, 敏夫"}],"nameIdentifiers":[{},{}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The scanner that moves the sample stage in three dimensions is a crucial device that limits the imaging rate of atomic force microscopy. This limitation derives mainly from the resonant vibrations of the scanner in the z direction (the most frequent scanning direction). Resonance originates in the scanner's mechanical structure as well as in the z piezoactuator itself. We previously demonstrated that the resonance originating in the structure can be minimized by a counterbalancing method. Here we report that the latter resonance from the actuator can be eliminated by an active damping method, with the result the bandwidth of the z scanner nearly reaches the first resonant frequency (150 kHz) of the z piezoactuator. © 2005 American Institute of Physics.","subitem_description_type":"Abstract"}]},"item_4_description_5":{"attribute_name":"提供者所属","attribute_value_mlt":[{"subitem_description":"金沢大学ナノ生命科学研究所 / 金沢大学理工研究域数物科学系","subitem_description_type":"Other"},{"subitem_description":"金沢大学理学部","subitem_description_type":"Other"}]},"item_4_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24517/00010139","subitem_identifier_reg_type":"JaLC"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics"}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1063/1.1903123","subitem_relation_type_select":"DOI"}}]},"item_4_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0034-6748","subitem_source_identifier_type":"ISSN"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kodera, Noriyuki"}],"nameIdentifiers":[{},{},{},{}]},{"creatorNames":[{"creatorName":"Yamashita, Hayato"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ando, Toshio"}],"nameIdentifiers":[{},{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-10-03"}],"displaytype":"detail","filename":"SC-PR-ANDO-T-15.pdf","filesize":[{"value":"1.8 MB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"SC-PR-ANDO-T-15.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/10152/files/SC-PR-ANDO-T-15.pdf"},"version_id":"3f9b5054-53f2-46db-b44a-22ff9317a4c4"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Active damping of the scanner for high-speed atomic force microscopy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Active damping of the scanner for high-speed atomic force microscopy"}]},"item_type_id":"4","owner":"3","path":["3021"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-10-03"},"publish_date":"2017-10-03","publish_status":"0","recid":"10152","relation_version_is_last":true,"title":["Active damping of the scanner for high-speed atomic force microscopy"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-07-27T10:16:04.234316+00:00"}