{"created":"2023-07-27T06:40:27.128883+00:00","id":29278,"links":{},"metadata":{"_buckets":{"deposit":"f4cd2793-c482-4f25-82ed-862ddc5523f5"},"_deposit":{"created_by":3,"id":"29278","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"29278"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00029278","sets":["1979:1980:1981"]},"author_link":["50239","50242","11069","50241","50240","11068"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-07-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4 II","bibliographicPageEnd":"2678","bibliographicPageStart":"2676","bibliographicVolumeNumber":"40","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Magnetics"}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper proposes an eddy-current testing (ECT) probe composed of a spin-valve giant magnetoresistance (SV-GMR) sensor and a meander coil for the inspection of bare printed circuit board. The SV-GMR sensor serves as a magnetic sensor for the ECT probe to sense the variation of the magnetic field distribution occurred on the printed circuit board. The SV-GMR sensor is used specifically to detect the changing magnetic field distribution occurred at the defect point. The characteristics of the proposed probe are discussed in this paper. The comparisons of signal-to-noise ratios obtained from ECT probe with SV-GMR sensor and with solenoid coil verify that the applying of SV-GMR sensor to the ECT probe can improve the PCB inspection results.","subitem_description_type":"Abstract"}]},"item_4_description_5":{"attribute_name":"提供者所属","attribute_value_mlt":[{"subitem_description":"金沢大学環日本海域環境研究センター生体機能計測研究部門","subitem_description_type":"Other"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/TMAG.2004.829254","subitem_relation_type_select":"DOI"}}]},"item_4_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://dx.doi.org/10.1109/TMAG.2004.829254","subitem_relation_type_select":"DOI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© IEEE 2004"}]},"item_4_source_id_11":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA00667933","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0018-9464","subitem_source_identifier_type":"ISSN"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yamada, Sotoshi"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Chomsuwan, K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Fukuda, Y."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Iwahara, Masayoshi"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Wakiwaka, H."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shoji, S."}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-10-05"}],"displaytype":"detail","filename":"TE-PR-YAMADA-S-07.pdf","filesize":[{"value":"373.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"TE-PR-YAMADA-S-07.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/29278/files/TE-PR-YAMADA-S-07.pdf"},"version_id":"ee8a7012-c856-4113-9b93-64481b9f0066"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Eddy-current testing probe with spin-valve type GMR sensor for printed circuit board inspection","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Eddy-current testing probe with spin-valve type GMR sensor for printed circuit board inspection"}]},"item_type_id":"4","owner":"3","path":["1981"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-10-05"},"publish_date":"2017-10-05","publish_status":"0","recid":"29278","relation_version_is_last":true,"title":["Eddy-current testing probe with spin-valve type GMR sensor for printed circuit board inspection"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-07-27T20:37:51.010929+00:00"}