{"created":"2023-07-27T06:40:27.317569+00:00","id":29282,"links":{},"metadata":{"_buckets":{"deposit":"54c4501a-95f0-4356-8f07-bbd0825881e1"},"_deposit":{"created_by":3,"id":"29282","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"29282"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00029282","sets":["1979:1980:1981"]},"author_link":["11069","50248","50247","50250","50249","11068"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-01-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"10","bibliographicPageEnd":"3624","bibliographicPageStart":"3622","bibliographicVolumeNumber":"41","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Magnetics"}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper describes the detection of conductive microbeads (PbSn) based on eddy-current testing (ECT) technique. High-frequency magnetic field applied to the conductive microbeads enables spin-valve giant magnetoresis-tance (SV-GMR) sensor to detect the magnetic fields occurred from eddy currents flowing in the conductive microbeads. In this paper, analysis of these magnetic fields by an analytical method is discussed and compared with experimental results. © 2005 IEEE.","subitem_description_type":"Abstract"}]},"item_4_description_5":{"attribute_name":"提供者所属","attribute_value_mlt":[{"subitem_description":"金沢大学環日本海域環境研究センター生体機能計測研究部門","subitem_description_type":"Other"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/TMAG.2005.855172","subitem_relation_type_select":"DOI"}}]},"item_4_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://dx.doi.org/10.1109/TMAG.2005.855172","subitem_relation_type_select":"DOI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© IEEE 2005"}]},"item_4_source_id_11":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA00667933","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0018-9464","subitem_source_identifier_type":"ISSN"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yamada, Sotoshi"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Chomsuwan, K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hagino, T."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tian, H."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Minamide, K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Iwahara, Masayoshi"}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-10-05"}],"displaytype":"detail","filename":"TE-PR-YAMADA-S-05.pdf","filesize":[{"value":"497.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"TE-PR-YAMADA-S-05.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/29282/files/TE-PR-YAMADA-S-05.pdf"},"version_id":"7c080870-a5ca-490f-9bb9-bc55246ffe87"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Conductive microbead array detection by high-frequency eddy-current testing technique with SV-GMR sensor","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Conductive microbead array detection by high-frequency eddy-current testing technique with SV-GMR sensor"}]},"item_type_id":"4","owner":"3","path":["1981"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-10-05"},"publish_date":"2017-10-05","publish_status":"0","recid":"29282","relation_version_is_last":true,"title":["Conductive microbead array detection by high-frequency eddy-current testing technique with SV-GMR sensor"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-07-27T20:37:48.719108+00:00"}