{"created":"2023-07-27T06:40:28.088488+00:00","id":29299,"links":{},"metadata":{"_buckets":{"deposit":"74f38784-92ad-4e59-9476-967cf5b928bb"},"_deposit":{"created_by":3,"id":"29299","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"29299"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00029299","sets":["1979:1980:1981"]},"author_link":["11069","50291","50292","11068"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1996-01-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5","bibliographicPageEnd":"4958","bibliographicPageStart":"4956","bibliographicVolumeNumber":"32","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Magnetics"}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper presents results pertaining to image data obtained from a planar meander-mesh coupled coil type ECT probe. The image data makes it possible to detect not only the existence of a defect but also to extract detailed information regarding the nature of the defect, such as its position, shape, length, and direction. In order to recognize a defect distinctly, we have fabricated the high sensitive planar coil which can be used to image a 2-D representation of the ECT signal. The relationships between the image pattern and defect shape are discussed. © 1996 IEEE.","subitem_description_type":"Abstract"}]},"item_4_description_5":{"attribute_name":"提供者所属","attribute_value_mlt":[{"subitem_description":"金沢大学環日本海域環境研究センター生体機能計測研究部門","subitem_description_type":"Other"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/20.539300","subitem_relation_type_select":"DOI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© IEEE 1996"}]},"item_4_source_id_11":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA00667933","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0018-9464","subitem_source_identifier_type":"ISSN"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yamada, Sotoshi"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Katou, Masaki"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Iwahara, Masayoshi"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Dawson, Francis P."}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-10-05"}],"displaytype":"detail","filename":"TE-PR-YAMADA-S-03.pdf","filesize":[{"value":"346.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"TE-PR-YAMADA-S-03.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/29299/files/TE-PR-YAMADA-S-03.pdf"},"version_id":"efccfc38-d9ef-4d74-85b4-1b485a86db4c"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Defect images by planar ect probe of meader-mesh coils","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Defect images by planar ect probe of meader-mesh coils"}]},"item_type_id":"4","owner":"3","path":["1981"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-10-05"},"publish_date":"2017-10-05","publish_status":"0","recid":"29299","relation_version_is_last":true,"title":["Defect images by planar ect probe of meader-mesh coils"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-07-27T11:17:13.665642+00:00"}