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  1. H-3. ナノマテリアル研究所
  2. h-3 10. 学術雑誌掲載論文
  3. 1. 査読済論文

Quantitative potential measurements of nanoparticles with different surface charges in liquid by open-loop electric potential microscopy

https://doi.org/10.24517/00039991
https://doi.org/10.24517/00039991
30f280ec-cd7f-484d-aacf-fc4ae177dd8b
名前 / ファイル ライセンス アクション
FR-PR-KOBAYASHI-N-44315.pdf FR-PR-KOBAYASHI-N-44315.pdf (253.6 kB)
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Item type 学術雑誌論文 / Journal Article(1)
公開日 2017-10-06
タイトル
タイトル Quantitative potential measurements of nanoparticles with different surface charges in liquid by open-loop electric potential microscopy
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
ID登録
ID登録 10.24517/00039991
ID登録タイプ JaLC
著者 Kobayashi, Naritaka

× Kobayashi, Naritaka

WEKO 11939
e-Rad 40595998

Kobayashi, Naritaka

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Asakawa, Hitoshi

× Asakawa, Hitoshi

WEKO 11946
金沢大学研究者情報 90509605
研究者番号 90509605

Asakawa, Hitoshi

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Fukuma, Takeshi

× Fukuma, Takeshi

WEKO 366
e-Rad 90452094
金沢大学研究者情報 90452094
研究者番号 90452094

Fukuma, Takeshi

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著者別表示 小林, 成貴

× 小林, 成貴

小林, 成貴

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淺川, 雅

× 淺川, 雅

淺川, 雅

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福間, 剛士

× 福間, 剛士

福間, 剛士

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提供者所属
内容記述タイプ Other
内容記述 金沢大学ナノマテリアル研究所
書誌情報 Journal of Applied Physics

巻 110, 号 4, p. 44315, 発行日 2011-08-15
ISSN
収録物識別子タイプ ISSN
収録物識別子 0021-8979
NCID
収録物識別子タイプ NCID
収録物識別子 AA00693547
DOI
関連タイプ isIdenticalTo
識別子タイプ DOI
関連識別子 10.1063/1.3625230
出版者
出版者 American Institute of Physics (AIP)
抄録
内容記述タイプ Abstract
内容記述 Local potential distribution plays important roles in physical, chemical and biological processes at a solid/liquid interface. However, the measurement of a local potential distribution in liquid has been a long-standing challenge, which has hindered understanding of the mechanisms for the various interfacial phenomena. Recently, we have developed a method to overcome this problem [Kobayashi, Rev. Sci. Instrum. 81, 123705 (2010)], which is referred to as open-loop electric potential microscopy (OL-EPM). Here, we present its first application to quantitative measurements of local potential distribution in liquid. In OL-EPM, an ac bias voltage is applied between a tip and sample and the first and second harmonic cantilever oscillations induced by the electrostatic force are detected and used for the calculation of a potential value. In the equation for the potential calculation, here we introduce a correction factor to cancel out the error caused by the difference in the deflection sensitivity to the first and second harmonic electrostatic forces. With the improved method, we have performed potential measurements of two types of latex beads with different surface charges. The measured potential difference between the different types of latex beads approximately corresponds to their zeta potential difference, which demonstrates the quantitative capability of OL-EPM. © 2011 American Institute of Physics.
著者版フラグ
出版タイプ VoR
出版タイプResource http://purl.org/coar/version/c_970fb48d4fbd8a85
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