{"created":"2023-07-27T06:50:04.833394+00:00","id":42552,"links":{},"metadata":{"_buckets":{"deposit":"ce8a5dc3-f961-42ab-93a4-86255266a805"},"_deposit":{"created_by":18,"id":"42552","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"42552"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00042552","sets":["934:935:936"]},"author_link":["67813","67816","67817","67812","67815","67814"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2015","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"457","bibliographicPageStart":"454","bibliographicVolumeNumber":"23","bibliographic_titles":[{"bibliographic_title":"Journal of the Japan Society of Applied Electromagnetics and Mechanics = 日本AEM学会誌"}]}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The remanence remaining in a volcanic rock is one of important measurement data in geophysics field. The sample of a rock has the remnant magnetization up to 10-9 T. Generally the remote magnetic fields measured by SQUID gradiometer presume the remanence of a rock as a sample. We propose a new methodology by measuring a magnetic field inside a cylindrical hole in the rotating sample. We could develop the simple measurement without shield system and high sensitivity sensor. The paper described the measurement system and the measured results of the rock. We could measure the remanence of a volcanic stone quarried from the volcanic rocks at Mt.Aso, Japan. \n \n\\n","subitem_description_type":"Abstract"}]},"item_10001_description_6":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Special Issue on the Asia-Pacific Symposium on Applied Electromagnetics and Mechanics (APSAEM2014) ","subitem_description_type":"Other"}]},"item_10001_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24517/00048906","subitem_identifier_reg_type":"JaLC"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"日本AEM学会 = The Japan Society of Applied Electromagnetics "}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.14243/jsaem.23.454","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"https://www.jstage.jst.go.jp/browse/jsaem/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.jstage.jst.go.jp/browse/jsaem/","subitem_relation_type_select":"URI"}},{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.jsaem.gr.jp/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.jsaem.gr.jp/","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 日本AEM学会 The Japan Society of Applied Electromagnetics and Mechanics"}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10457520","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0919-4452 ","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"山田, 外史"}],"nameIdentifiers":[{"nameIdentifier":"67812","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"T., Minamitani","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67813","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"D., Wakaura","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67814","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sotoshi, Yamada","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67815","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"H., Sakai","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67816","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"J., Fujii","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67817","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-11-16"}],"displaytype":"detail","filename":"TE-PR-YAMADA-S-335.pdf","filesize":[{"value":"204.7 kB"}],"format":"application/pdf","licensetype":"license_6","mimetype":"application/pdf","url":{"label":"TE-PR-YAMADA-S-335.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/42552/files/TE-PR-YAMADA-S-335.pdf"},"version_id":"f94ab16c-1827-4d94-a186-f2912f706410"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"remanence","subitem_subject_scheme":"Other"},{"subitem_subject":"magnetic sensor","subitem_subject_scheme":"Other"},{"subitem_subject":"through-hole","subitem_subject_scheme":"Other"},{"subitem_subject":"rotation","subitem_subject_scheme":"Other"},{"subitem_subject":"geomagnetism","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Methodology of Measuring Minite Remanence up to Submicron Tesla Level","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Methodology of Measuring Minite Remanence up to Submicron Tesla Level"}]},"item_type_id":"10001","owner":"18","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-11-16"},"publish_date":"2017-11-16","publish_status":"0","recid":"42552","relation_version_is_last":true,"title":["Methodology of Measuring Minite Remanence up to Submicron Tesla Level"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2023-07-27T17:49:42.981290+00:00"}