{"created":"2023-07-27T06:50:05.058150+00:00","id":42557,"links":{},"metadata":{"_buckets":{"deposit":"4a0e1af2-d26c-4ae3-b288-7296c26f88a0"},"_deposit":{"created_by":18,"id":"42557","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"42557"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00042557","sets":["934:935:936"]},"author_link":["67842","67844","67843","67841","67845"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2007","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"3","bibliographicPageEnd":"305","bibliographicPageStart":"302","bibliographicVolumeNumber":"15","bibliographic_titles":[{"bibliographic_title":"Journal of the Japan Society of Applied Electromagnetics and Mechanics = 日本AEM学会誌"}]}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper describes high-speed printed circuit board (PCB) inspection based on eddy-current testing (ECT) technique. The proposed ECT probe consists only of meander exciter coil and multi spin-valve giant magnetoresistance (SV-GMR) sensor that it was designed for detection of microcrack on PCB surface. To conduct high-speed scanning, harmonic analysis based on Fourier analysis is applied to acquire ECT signal at fundamental frequency. Signal variation at defect point is enhanced by applied averaging of multisignal obtained from the multi SV-GMR sensor.","subitem_description_type":"Abstract"}]},"item_10001_description_6":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Special Issue of the Asia-Pacific Symposium on Applied Electromagnetics and Mechanics (APSAEM06)","subitem_description_type":"Other"}]},"item_10001_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24517/00048911","subitem_identifier_reg_type":"JaLC"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"日本AEM学会 = The Japan Society of Applied Electromagnetics "}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"https://www.jstage.jst.go.jp/browse/jsaem/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.jstage.jst.go.jp/browse/jsaem/","subitem_relation_type_select":"URI"}},{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.jsaem.gr.jp/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.jsaem.gr.jp/","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 日本AEM学会 The Japan Society of Applied Electromagnetics and Mechanics"}]},"item_10001_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10457520","subitem_source_identifier_type":"NCID"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0919-4452 ","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"山田, 外史"}],"nameIdentifiers":[{"nameIdentifier":"67841","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"岩原, 正吉"}],"nameIdentifiers":[{"nameIdentifier":"67842","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"K., Chomsuwan","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67843","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sotoshi, Yamada","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67844","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Masayoshi, Iwahara","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"67845","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-11-16"}],"displaytype":"detail","filename":"TE-PR-YAMADA-S-275.pdf","filesize":[{"value":"422.6 kB"}],"format":"application/pdf","licensetype":"license_6","mimetype":"application/pdf","url":{"label":"TE-PR-YAMADA-S-275.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/42557/files/TE-PR-YAMADA-S-275.pdf"},"version_id":"b046a358-90ca-4fda-9e32-8e2c93c62b86"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Eddy-current","subitem_subject_scheme":"Other"},{"subitem_subject":"Spin-valve giant magnetoresistance (SV-GMR)","subitem_subject_scheme":"Other"},{"subitem_subject":"Multisensor","subitem_subject_scheme":"Other"},{"subitem_subject":"Harmonic analysis","subitem_subject_scheme":"Other"},{"subitem_subject":"Printed circuit board (PCB)","subitem_subject_scheme":"Other"},{"subitem_subject":"Signal averaging","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"High-speed PCB Inspection System Based on ECT Technique With Multi SV-GMR Sensor","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"High-speed PCB Inspection System Based on ECT Technique With Multi SV-GMR Sensor"}]},"item_type_id":"10001","owner":"18","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-11-16"},"publish_date":"2017-11-16","publish_status":"0","recid":"42557","relation_version_is_last":true,"title":["High-speed PCB Inspection System Based on ECT Technique With Multi SV-GMR Sensor"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2023-07-27T17:49:39.666562+00:00"}