{"created":"2023-07-27T06:50:11.142674+00:00","id":42856,"links":{},"metadata":{"_buckets":{"deposit":"84164637-3914-4f45-944d-1285422c4a54"},"_deposit":{"created_by":18,"id":"42856","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"42856"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00042856","sets":["934:935:936"]},"author_link":["68520","68518","68519","73490","68521","73489"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2001","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1-4 SPEC","bibliographicPageEnd":"506","bibliographicPageStart":"503","bibliographicVolumeNumber":"14","bibliographic_titles":[{"bibliographic_title":"International Journal of Applied Electromagnetics and Mechanics"}]}]},"item_4_creator_33":{"attribute_name":"著者別表示","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"山田, 外史"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"岩原, 正吉"}],"nameIdentifiers":[{}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper presents an image processing method for eddy-current testing for the detection of the defects with a specific orientation. The method utilizes the fact that a line-shaped signal is, through the Fourier transform, mapped onto a line passing through the origin and perpendicular to the orientation of the original signal. Hence, nonseparable fan filters is used to select the frequency components corresponding to the defects orientated in a Specific direction. This approach enables more precise control of the extraction characteristics of signals compared to the iterative application of one-dimensional (1-D) filtering in the vertical and horizontal directions, in which the shape of the pass band is restricted to a geometry made from squares. The effectiveness of the proposed method is shown by a demonstration using a metallic sample with a defect aligned in a number of directions.","subitem_description_type":"Abstract"}]},"item_4_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24517/00049205","subitem_identifier_reg_type":"JaLC"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"The Japan Society of Applied Electromagnetics and Mechanics (JSAEM) = 日本AEM学会"}]},"item_4_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.jsaem.gr.jp/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.jsaem.gr.jp/","subitem_relation_type_select":"URI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © The Japan Society of Applied Electromagnetics and Mechanics (JSAEM) 日本AEM学会"}]},"item_4_source_id_11":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA11051133","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1383-5416","subitem_source_identifier_type":"ISSN"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Taniguchi, T."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nakamura, K."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamada, Sotoshi"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Iwahara, Masayoshi"}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-12-07"}],"displaytype":"detail","filename":"TE-PR-YAMADA-S-208.pdf","filesize":[{"value":"405.2 kB"}],"format":"application/pdf","licensetype":"license_6","mimetype":"application/pdf","url":{"label":"TE-PR-YAMADA-S-208.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/42856/files/TE-PR-YAMADA-S-208.pdf"},"version_id":"6a4cbb90-82d9-4713-9a1f-3e097eb0dc4e"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Image processing in eddy-current testing for extraction of orientations of defects","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Image processing in eddy-current testing for extraction of orientations of defects"}]},"item_type_id":"4","owner":"18","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-12-07"},"publish_date":"2017-12-07","publish_status":"0","recid":"42856","relation_version_is_last":true,"title":["Image processing in eddy-current testing for extraction of orientations of defects"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2023-07-27T17:40:18.691740+00:00"}