{"created":"2023-07-27T06:50:11.459950+00:00","id":42863,"links":{},"metadata":{"_buckets":{"deposit":"4cd6b5bb-0537-4ac9-a542-a12966e99552"},"_deposit":{"created_by":18,"id":"42863","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"42863"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00042863","sets":["934:935:936"]},"author_link":["13691","13678","68548","73306","68547","73307"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-06-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"100","bibliographicPageStart":"95","bibliographicVolumeNumber":"16","bibliographic_titles":[{"bibliographic_title":"日本AEM学会誌"},{"bibliographic_title":"Journal of the Japan Society of Applied Electromagnetics","bibliographic_titleLang":"en"}]}]},"item_4_creator_33":{"attribute_name":"著者別表示","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"山田, 外史"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"別所, 一夫"}],"nameIdentifiers":[{}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In this paper we propose a model to reproduce a PCS pattern eddy current testing signal based on 3D FEM package and scanning simulation. In this method we consider some common PCB elements as test pieces while a simple Meander-type coil is utilized as excitation coil above the elements. Numerical solution to the above problem with the help of a 3D FEM provides the magnetic flux density in the region above the PCB test elements. Shifting the test element's position step by step and repeating the numerical calculation for each of the test elements new positions, the scanning process of a PCB test piece is simulated. Analysing and smoothing the magnetic field data from all of the aforementioned steps provide the final PCB pattern signal. Image processing technique was applied to obtain the PCB part image.","subitem_description_type":"Abstract"}]},"item_4_description_22":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Special Issue on 16th MAGADA Conference","subitem_description_type":"Other"}]},"item_4_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24517/00049212","subitem_identifier_reg_type":"JaLC"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"日本AEM学会 = The Japan Society of Applied Electromagnetics and Mechanics"}]},"item_4_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.jsaem.gr.jp/index.html"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.jsaem.gr.jp/index.html","subitem_relation_type_select":"URI"}},{"subitem_relation_name":[{"subitem_relation_name_text":"https://www.jstage.jst.go.jp/browse/jsaem"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.jstage.jst.go.jp/browse/jsaem","subitem_relation_type_select":"URI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 日本AEM学会 The Japan Society of Applied Electromagnetics and Mechanics"}]},"item_4_source_id_11":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AN10457520","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0919-4452","subitem_source_identifier_type":"ISSN"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hossein, Bayani"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nishino, Masanobu"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamada, Sotoshi"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Iwahara, Masayoshi"}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-12-07"}],"displaytype":"detail","filename":"TE-PR-YAMADA-S-280.pdf","filesize":[{"value":"431.2 kB"}],"format":"application/pdf","licensetype":"license_6","mimetype":"application/pdf","url":{"label":"TE-PR-YAMADA-S-280.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/42863/files/TE-PR-YAMADA-S-280.pdf"},"version_id":"69d8e7a0-e4a9-45c8-b637-4ef84db21cdd"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Introduction of a Base-Model for Eddy Current Testing of Printed Circuit Boards","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Introduction of a Base-Model for Eddy Current Testing of Printed Circuit Boards"},{"subitem_title":"Introduction of a Base-Model for Eddy Current Testing of Printed Circuit Boards","subitem_title_language":"en"}]},"item_type_id":"4","owner":"18","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-12-07"},"publish_date":"2017-12-07","publish_status":"0","recid":"42863","relation_version_is_last":true,"title":["Introduction of a Base-Model for Eddy Current Testing of Printed Circuit Boards"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2023-07-27T17:39:33.099050+00:00"}