{"created":"2023-07-27T06:50:38.895433+00:00","id":43645,"links":{},"metadata":{"_buckets":{"deposit":"3fe2eed5-26f4-4d6a-a684-875b51d28c6e"},"_deposit":{"created_by":18,"id":"43645","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"43645"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00043645","sets":["934:935:936"]},"author_link":["71589","70213","71588","70211"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2003","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"K04","bibliographicPageEnd":"458","bibliographicPageStart":"458","bibliographicVolumeNumber":"2003 Spring","bibliographic_titles":[{"bibliographic_title":"精密工学会学術講演会講演論文集"},{"bibliographic_title":"2003 JSPE Spring Meeting","bibliographic_titleLang":"en"}]}]},"item_4_creator_33":{"attribute_name":"著者別表示","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Adachi, Masaaki"}],"nameIdentifiers":[{"nameIdentifier":"70211","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"50212519","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=50212519"},{"nameIdentifier":"50212519","nameIdentifierScheme":"研究者番号","nameIdentifierURI":"https://nrid.nii.ac.jp/nrid/1000050212519"}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"1波長のレーザを用いた変形測定は，変形が小さく画像取込毎の変形による光路差変化量が半波長以内である時のみ応用が可能である。画像取込の前後で1波長以上の光路差変化がある場合は，そのような変形が多く存在するにもかかわらずこれまで測定が出来なかった。そこで2波長のレーザを同時に用いる変形測定法をこれまで研究してきた。この開発結果について報告する。","subitem_description_type":"Abstract"}]},"item_4_description_22":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"出版者照会後に全文公開","subitem_description_type":"Other"}]},"item_4_description_5":{"attribute_name":"提供者所属","attribute_value_mlt":[{"subitem_description":"金沢大学理工研究域機械工学系","subitem_description_type":"Other"}]},"item_4_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24517/00049987","subitem_identifier_reg_type":"JaLC"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"精密工学会 = The Japan Society for Precision Engineering"}]},"item_4_relation_11":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"BA90159927","subitem_relation_type_select":"NCID"}}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.11522/pscjspe.2003S.0.567.0","subitem_relation_type_select":"DOI"}}]},"item_4_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"https://www.jstage.jst.go.jp/browse/pscjspe/-char/ja/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.jstage.jst.go.jp/browse/pscjspe/-char/ja/","subitem_relation_type_select":"URI"}},{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.jspe.or.jp/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.jspe.or.jp/","subitem_relation_type_select":"URI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © The Japan Society for Precision Engineering"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"安達, 正明"}],"nameIdentifiers":[{"nameIdentifier":"70213","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"50212519","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=50212519"}]},{"creatorNames":[{"creatorName":"丹原, 嘉彦"}],"nameIdentifiers":[{"nameIdentifier":"71588","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"岡田, 幸司"}],"nameIdentifiers":[{"nameIdentifier":"71589","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-06-15"}],"displaytype":"detail","filename":"TE-PR-ADACHI-M-458.pdf","filesize":[{"value":"56.9 kB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"TE-PR-ADACHI-M-458.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/43645/files/TE-PR-ADACHI-M-458.pdf"},"version_id":"05025455-c7d9-4b7a-896c-293cdaa6536a"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"2波長レーザ光を用いた粗面物体の変形位相測定","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"2波長レーザ光を用いた粗面物体の変形位相測定"},{"subitem_title":"Deformation-Phase Measurement of Diffuse Objects by using Two Laser Beams of Different Wavelengths","subitem_title_language":"en"}]},"item_type_id":"4","owner":"18","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-06-15"},"publish_date":"2018-06-15","publish_status":"0","recid":"43645","relation_version_is_last":true,"title":["2波長レーザ光を用いた粗面物体の変形位相測定"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2024-06-20T06:45:20.131959+00:00"}