{"created":"2023-07-27T06:50:39.160440+00:00","id":43651,"links":{},"metadata":{"_buckets":{"deposit":"1d5e2680-045f-4cba-b134-3039cac28a93"},"_deposit":{"created_by":18,"id":"43651","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"43651"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00043651","sets":["934:935:936"]},"author_link":["70211","71572","71571","70213","71610","71609"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"K37","bibliographicPageEnd":"808","bibliographicPageStart":"807","bibliographicVolumeNumber":"2009 Spring","bibliographic_titles":[{"bibliographic_title":"精密工学会学術講演会講演論文集"},{"bibliographic_title":"2009 JSPE Spring 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microscope","subitem_title_language":"en"}]},"item_type_id":"4","owner":"18","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-06-15"},"publish_date":"2018-06-15","publish_status":"0","recid":"43651","relation_version_is_last":true,"title":["干渉顕微鏡観察下の粗面の垂直変位測定"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2023-07-27T17:03:31.885572+00:00"}