{"created":"2023-07-27T06:52:09.821971+00:00","id":45922,"links":{},"metadata":{"_buckets":{"deposit":"58ef74d5-81c5-4ae9-8b03-8fea1a61770a"},"_deposit":{"created_by":18,"id":"45922","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"45922"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00045922","sets":["2812:2813:2821"]},"author_link":["79753","2241"],"item_9_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-05-23","bibliographicIssueDateType":"Issued"},"bibliographicPageStart":"4p.","bibliographicVolumeNumber":"2011-2012","bibliographic_titles":[{"bibliographic_title":"平成24(2012)年度 科学研究費補助金 若手研究(B) 研究成果報告書"},{"bibliographic_title":"2012 Fiscal Year Final Research Report","bibliographic_titleLang":"en"}]}]},"item_9_creator_33":{"attribute_name":"著者別表示","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{}],"nameIdentifiers":[{},{}]}]},"item_9_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"本研究では,高精度の非弾性電子トンネル分光(Inelastic electron tunneling spectroscopy : IETS)を計測し,その分析法としての有用性を示すために,走査トンネル顕微鏡(Scanning tunneling Microscope : STM)の改良および測定系の構築を行った.その結果\n(1)STM-IETSの計測にとって理想的な欠陥の少ない広いテラスをもったアルカンチオール自己組織化単分子膜(Self-assembled monolayer: SAM)が作製できるようになり\n(2)このSAMに対して,微分コンダクタンスの二次元像を安定して計測できるようになった.\n装置改良と並行して,これまで計測してきたIETSの実験結果,新しく取得した赤外分光のデータ,密度汎関数法による理論的研究をもとに,新しい視点から非弾性トンネル分光に関する研究をまとめProgress in Surface Science において報告した.表面上の分子に対する非弾性電子トンネル過程の研究と関連して,ナノデバイス系においても非弾性電子トンネル過程が発現し,伝導コンダクタンスに影響を与える事を見出した.","subitem_description_type":"Abstract"},{"subitem_description":"In the present study, in order to measure STM-IETS with high precision and demonstrate its availability as a characterization method, an STM and its measurement system havebeen modified. Owing to this modification\n(1) alkanethiol SAM surfaces with large terrace and defect free suitable for IETS were fabricated and\n(2) dI/dV mapping for alkanethiolSAM surfaces on Au(111) surfaces were repeatedly obtained.\nAlong with the modification of the experimental setup, IET processes for alkanethiol SAM have been reviewed and reported in Progress in Surface Science with new view point, based on the so far obtained IETS data, newly acquired Infrared spectroscopy, theory with density functional theory.Appearance of the IET process in the electron transport through a nanodevice and its influence on the conductions were also found.","subitem_description_type":"Abstract"}]},"item_9_description_22":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"研究課題/領域番号:23710113, 研究期間(年度):2011-2012","subitem_description_type":"Other"},{"subitem_description":"出典：研究課題「非弾性電子トンネル分光による三次元元素イメージング」課題番号23710113\n（KAKEN：科学研究費助成事業データベース（国立情報学研究所））\n（https://kaken.nii.ac.jp/report/KAKENHI-PROJECT-23710113/23710113seika/）を加工して作成","subitem_description_type":"Other"}]},"item_9_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24517/00052256","subitem_identifier_reg_type":"JaLC"}]},"item_9_publisher_17":{"attribute_name":"公開者","attribute_value_mlt":[{"subitem_publisher":"金沢大学理工研究域数物科学系"}]},"item_9_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/search/?qm=90387853"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/search/?qm=90387853","subitem_relation_type_select":"URI"}},{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-23710113/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-23710113/","subitem_relation_type_select":"URI"}},{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/report/KAKENHI-PROJECT-23710113/23710113seika/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/report/KAKENHI-PROJECT-23710113/23710113seika/","subitem_relation_type_select":"URI"}}]},"item_9_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-09-28"}],"displaytype":"detail","filename":"SC-PR-OKABAYASHI-N-kaken 2013-4p.pdf","filesize":[{"value":"480.9 kB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"SC-PR-OKABAYASHI-N-kaken 2013-4p.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/45922/files/SC-PR-OKABAYASHI-N-kaken 2013-4p.pdf"},"version_id":"ebc6376d-ea9b-427b-ae5e-7c7c580edc7d"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"非弾性電子トンネル分光による三次元元素イメージング","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"非弾性電子トンネル分光による三次元元素イメージング"},{"subitem_title":"Three Dimensional Element Analysis by Using Inelastic Electron Tunneling Spectroscopy","subitem_title_language":"en"}]},"item_type_id":"9","owner":"18","path":["2821"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-10-01"},"publish_date":"2018-10-01","publish_status":"0","recid":"45922","relation_version_is_last":true,"title":["非弾性電子トンネル分光による三次元元素イメージング"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2023-07-27T12:32:00.463194+00:00"}