{"created":"2023-07-27T06:52:33.561971+00:00","id":46557,"links":{},"metadata":{"_buckets":{"deposit":"5c1c10bb-610b-4788-b48d-76deda8a7576"},"_deposit":{"created_by":18,"id":"46557","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"46557"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00046557","sets":["2812:2813:2818"]},"author_link":["1945","80573"],"item_9_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-06-13","bibliographicIssueDateType":"Issued"},"bibliographicPageStart":"5p.","bibliographicVolumeNumber":"2014-04-01 - 2016-03-31","bibliographic_titles":[{"bibliographic_title":"平成27(2015)年度 科学研究費補助金 挑戦的萌芽研究 研究成果報告書"},{"bibliographic_title":"2015 Fiscal Year Final Research Report","bibliographic_titleLang":"en"}]}]},"item_9_creator_33":{"attribute_name":"著者別表示","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Arai, Toyoko"}],"nameIdentifiers":[{"nameIdentifier":"80573","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"20250235","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=20250235"}]}]},"item_9_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"本研究は、自作超高真空非接触原子間力顕微鏡（nc-AFM）を用いて、清浄Si探針をプロトンアクセプター（A）とし、試料基板に形成したプロトンドナー（X-H）との水素結合[X-H…A]を1結合単位で調べることを目的とした。試料は、Si(111)7x7表面に微量のNH2とHが吸着した表面を用いた。Nc-AFM像、トンネル電流像、および、Δf―距離曲線から、吸着サイトを同定した。Si-Siの共有結合力は約1.0 (nN)であり、NH2基とSi探針の水素結合 [Si-N-H…Si]の最大引力は約0.05（nN）、H基とSi探針の水素結合 [Si-H…Si] の最大引力は約0.1 (nN)であった。","subitem_description_type":"Abstract"},{"subitem_description":"The hydrogen bond was investigated with atomic resolution by a homebuilt non-contact atomic force microscope (nc-AFM) in ultrahigh vacuum. The hydrogen bond [X-H…A] was made with an apex atom of a clean Si tip as a proton acceptor (A) and a proton donor (X-H) adsorbed on a sample substrate. The samples were Si(111)7x7 surfaces adsorbed NH2 group and H group. I identified those adsorption sites from Nc-AFM images, tunneling current images and Δf- distance curves. The maximum covalent bonding force of Si-Si was approximately 1.0 (nN). I estimated that the hydrogen bonding force between the NH2 group and the Si tip [Si-N-H…Si] was approximately 0.05 (nN) and between the H group and the Si tip [Si-H…Si] was approximately 0.1 (nN).","subitem_description_type":"Abstract"}]},"item_9_description_22":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"研究課題/領域番号:26600098, 研究期間(年度):2014-04-01 - 2016-03-31","subitem_description_type":"Other"},{"subitem_description":"出典：研究課題「電圧印加非接触原子間力顕微鏡／分光法による水素結合の原子分解能解析」課題番号:26600098\n（KAKEN：科学研究費助成事業データベース（国立情報学研究所））\n（https://kaken.nii.ac.jp/report/KAKENHI-PROJECT-26600098/26600098seika/）を加工して作成","subitem_description_type":"Other"}]},"item_9_description_5":{"attribute_name":"提供者所属","attribute_value_mlt":[{"subitem_description":"金沢大学理工研究域数物科学系","subitem_description_type":"Other"}]},"item_9_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24517/00052889","subitem_identifier_reg_type":"JaLC"}]},"item_9_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/search/?qm=20250235"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/search/?qm=20250235","subitem_relation_type_select":"URI"}},{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-26600098/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-26600098/","subitem_relation_type_select":"URI"}},{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/report/KAKENHI-PROJECT-26600098/26600098seika/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/report/KAKENHI-PROJECT-26600098/26600098seika/","subitem_relation_type_select":"URI"}}]},"item_9_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"新井, 豊子"}],"nameIdentifiers":[{"nameIdentifier":"1945","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"20250235","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=20250235"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-12-10"}],"displaytype":"detail","filename":"SC-PR-ARAI-T-kaken 2016-5p.pdf","filesize":[{"value":"875.0 kB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"SC-PR-ARAI-T-kaken 2016-5p.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/46557/files/SC-PR-ARAI-T-kaken 2016-5p.pdf"},"version_id":"c49a758b-57d2-4e25-8dc7-6f4a705fea56"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"電圧印加非接触原子間力顕微鏡／分光法による水素結合の原子分解能解析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"電圧印加非接触原子間力顕微鏡／分光法による水素結合の原子分解能解析"},{"subitem_title":"Investigation of Hydrogen Bond by Bias Noncontact Atmic Force Microscopy/Spectroscopy","subitem_title_language":"en"}]},"item_type_id":"9","owner":"18","path":["2818"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-12-10"},"publish_date":"2018-12-10","publish_status":"0","recid":"46557","relation_version_is_last":true,"title":["電圧印加非接触原子間力顕微鏡／分光法による水素結合の原子分解能解析"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2024-07-01T05:44:40.869274+00:00"}