{"created":"2023-07-27T06:52:45.411124+00:00","id":46863,"links":{},"metadata":{"_buckets":{"deposit":"1994c6f7-5d13-4ef6-a6f8-3e08239a3e9d"},"_deposit":{"created_by":18,"id":"46863","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"46863"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00046863","sets":["2812:2813:2833"]},"author_link":["2909","81658"],"item_9_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2002-01","bibliographicIssueDateType":"Issued"},"bibliographicPageStart":"82p.","bibliographicVolumeNumber":"1999-2000","bibliographic_titles":[{"bibliographic_title":"平成12(2000)年度 科学研究費補助金 基盤研究(C) 研究成果報告書"},{"bibliographic_title":"2001 Fiscal Year Final Research Report","bibliographic_titleLang":"en"}]}]},"item_9_creator_33":{"attribute_name":"著者別表示","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{}],"nameIdentifiers":[{},{}]}]},"item_9_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"プラズマが乱流状態になると、内部にはキャビトンと呼ばれる波束が多数できていると理論的には考えられている。しかしながら、実験でキャビトンを測定することは難しく、その3次元的な構造を明確に捕らえた例はない。当研究はキャビトン電場の測定を目的とし、電子ビームプローブ法の応用を行った。電子ビームプローブ法というのはプラズマ内部の電場を測定するのに使われる手法であり、ビームの偏向を測定して未知の電場を予想するものである。普通は、細く平行なプローブビームが用いられており、これまでは我々もこの方法で偏向角の大きさや偏向形態を測定しようと努力してきた。しかし、キャビトン電場以外の原因により偏向が生じた可能性があることが指摘されていた。この研究の初期においては測定自体の信頼性を高めるために,いくつかの新しい試みを装置に施している。これらはこれまでの技術的な問題点を解決したが,特にこれによって測定の感度を上げることができた。そこで、さらに新しい試みとして普通,誘電率の空問分布を測定するのに光学的に行われているシャドウグラフを、電子ビームを用いて試みた。電場の影絵を映してみること、つまり、偏向の空間分布の測定をすることを意味するが、これまでに電子ビームが用いられた例はまだなかった。結果はうまくいき、電子ビームのシャドーグラフを実現することに成功した。観測された偏向像には、特有な網目の構造が観測された。これは我々のプラズマの内部には(乱流電場で期待されるような)複雑な電場の空間分布があることを意味する。さらに編目の大きさがデバイ長の20倍程度の大きさを持つことが実験から示された。一方で、理論的解析を進めた結果、キャビトン電場による偏向は崩壊終盤のサイズの小さくなるときにしか得られないという新たな見解を示すことができた。これらは実験結果をうまく説明している。今後、研究を進めるうえで一つの方向性を示すことができた。","subitem_description_type":"Abstract"},{"subitem_description":"Langmuir wave becomes unstable at the large amplitude, and possibly produces a number of localized wave packets of Langmuir wave, which is called a caviton. The nonlinear properties are investigated strongly in the theory of the strong Langmuir turbulent. Generally, measurements of the electric field is difficult, and the 3-dimensional structure of the caviton which is predicted from the theory is not revealed well. The purpose of this research is to study such turbulence field using electron-beam probing-technique. The diagnosis is well known as a method to measure un-known electric field from deflection of the trajectory of a probing beam. Usually a well-focused parallel beam is used for this purpose, and we employed this type of beam for previous experiments. Our study showed difficulties of the method, because the observed deflections could not be attributed only to the caviton fields but other mechanisms. Large ambiguities were left there.\nAt first, the technical problems, that deg rade the quality of the data, are solved. It makes possible to detect a probing beam that has much lower density, and raise the reliability of the measurement, and give another possibility. Second, a shadowgraph technique using an electron beam is tried. This is first report to apply the technique for diagnostic. An employment of a large diameter probing-beam makes it possible to detect the special distribution of the deflection. Many bubbles were found in the beam pattern images. It is apparent that a sophisticated field, which is like the one expected from the turbulent theory, exists in our plasma. The averaged size of babbles is change by the plasma density and is estimated about 20 times of the Debye-length in the experiment. On the other side, a theoretical investigation pointed out the fact that the deflection angle becomes prominent only when the cavitons are at final stage of the collapse. It is possible to explain why the small babbles are observed in the experiment, though the turbulent theory says the population of the caviton with larger size is expected to be higher.","subitem_description_type":"Abstract"}]},"item_9_description_22":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"研究課題/領域番号:11680479, 研究期間(年度):1999-2000","subitem_description_type":"Other"},{"subitem_description":"出典：「大強度電子ビーム・プラズマ相互作用後の残留強静電場の電子ビームプローブによる測定」研究成果報告書　課題番号11680479\n  (KAKEN：科学研究費助成事業データベース（国立情報学研究所）)\n　　　本文データは著者版報告書より作成","subitem_description_type":"Other"}]},"item_9_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24517/00053190","subitem_identifier_reg_type":"JaLC"}]},"item_9_publisher_17":{"attribute_name":"公開者","attribute_value_mlt":[{"subitem_publisher":"金沢大学理工研究域数物科学系"}]},"item_9_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/search/?qm=80212679"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/search/?qm=80212679","subitem_relation_type_select":"URI"}},{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-11680479/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-11680479/","subitem_relation_type_select":"URI"}},{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/report/KAKENHI-PROJECT-11680479/116804792001kenkyu_seika_hokoku_gaiyo/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/report/KAKENHI-PROJECT-11680479/116804792001kenkyu_seika_hokoku_gaiyo/","subitem_relation_type_select":"URI"}}]},"item_9_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-02-14"}],"displaytype":"detail","filename":"SC-PR-ANDO-R-kaken 2002-82p.pdf","filesize":[{"value":"6.2 MB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"SC-PR-ANDO-R-kaken 2002-82p.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/46863/files/SC-PR-ANDO-R-kaken 2002-82p.pdf"},"version_id":"769e8cbb-cb70-430f-be82-0c87f2a5440a"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"大強度電子ビーム・プラズマ相互作用後の残留強静電場の電子ビームプローブによる測定","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"大強度電子ビーム・プラズマ相互作用後の残留強静電場の電子ビームプローブによる測定"},{"subitem_title":"Study of the strong electrostatic fields leaved after an interaction between an intense electron beam and plasma","subitem_title_language":"en"}]},"item_type_id":"9","owner":"18","path":["2833"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-02-14"},"publish_date":"2019-02-14","publish_status":"0","recid":"46863","relation_version_is_last":true,"title":["大強度電子ビーム・プラズマ相互作用後の残留強静電場の電子ビームプローブによる測定"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2023-07-27T14:47:05.988339+00:00"}