{"created":"2023-07-27T06:53:08.457376+00:00","id":47456,"links":{},"metadata":{"_buckets":{"deposit":"2980fc25-ceb2-4925-85b3-8e2c4f985019"},"_deposit":{"created_by":18,"id":"47456","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"47456"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00047456","sets":["2812:2813:2836"]},"author_link":["13046","2109"],"item_9_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1998-03","bibliographicIssueDateType":"Issued"},"bibliographicPageStart":"89p.","bibliographicVolumeNumber":"1996-1997","bibliographic_titles":[{"bibliographic_title":"平成9(1997)年度 科学研究費補助金 基盤研究(A) 研究成果報告書"},{"bibliographic_title":"1997 Fiscal Year Final Research Report","bibliographic_titleLang":"en"}]}]},"item_9_creator_33":{"attribute_name":"著者別表示","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{}],"nameIdentifiers":[{},{}]}]},"item_9_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"光導波路や光ファイバーの内部診断・特性評価を目的として、半導体レーザを光源に用いたコヒーレントOFDR法(FMCW法)の構築を行った。光導波路診断を目的とする場合には1mm程度の空間分解能を目指し、光ファイバ診断の目的とする場合には1km以上の診断可能距離を目指してシステムを構築した。得られた結果は以下の通りである。\n1.光周波数掃引の非線形性により空間分解能が劣化することを示し、その解決法として、(1)ディジタルフィルタを用いて半導体レーザの変調波形を補正する方法、(2)方形波が重畳された三角波で半導体レーザを変調する方法の2つの方法を提案した。これらの方法を用いることにより空間分解能は約6倍向上し、理論値とほぼ等しい値(2mm)を得た。\n2.FMCWリフレクトメトリにおいて、理論的空間分解能より優れた空間分解能を得るため、受光信号を最大エントロピー法を用いてスペクトル解析する方法を提案した。最大エントロピー法を用いることにより、理論的空間分解能(7.5mm)を上回る空間分解能(2.5mm)を得た。また、拡張された最大エントロピー法を用いることにより、最高で100μm程度の空間分解能が得られることを実験的に示した。\n3.さらに長い診断距離を得るため、光の干渉を用いないシステムを構成した。参照光と反射光との光路長差が光源の可干渉距離よりも長いのが特徴であり、スペクトル線幅が狭いほど空間分解能は向上する。そのため、外部共振器構造の半導体レーザを光源に用いて非干渉のFMCWリフレクトメトリを構成し、11km遠方において空間分解能60mを得た。また、光ファイバの後方レイリー散乱光を高感度で検出できること、検出した後方レイリー散乱光から光ファイバの伝搬損失、コネクタ接続された光ファイバの接続損失の評価が可能であることを示した。","subitem_description_type":"Abstract"},{"subitem_description":"The FMCW reflectometry using a laser diode as a light source was developed for diagnosing and characterizing optical waveguides and optical figers. The results of the study are as follows.\n1. The spatial resolution is found to be degraded due to nolinearity of the optical frequency sweep, and the two methods were developed to enhance the spatial resolution ; one is modifying the modulation waveform of the injection cuurent of the laser by using a digital filter, and the other is modulating the injection current of the laser with a triangular signal on which a rectangular signal is superimposed. The spatial resolution was improved by a factor of 6, and the experimental resolution agreed with the theoretical resolution.\n2. The maximum entropy method (MEM) was used to analyze the detected signal to achieve high spatial resolution. The spatial resolution by the MEM is smaller than the conventional theoretical resolution. The spatial resolution of about 100 mum was also achieved by using the extended MEM.\n3. The incoherent FMCW reflectometry was developed to diagnose long optical fibers. The spatial resolution can be improved by using a light source with narrow linewidth. The spatial resolution of 60 m was achieved at the far end of an 11 km-long optical fiber. The Rayleigh backscattering in the fiber was also detected, and the propagation loss of the fiber and the connection loss of two fibers were estimated.","subitem_description_type":"Abstract"}]},"item_9_description_22":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"研究課題/領域番号:08555090, 研究期間(年度):1996-1997","subitem_description_type":"Other"},{"subitem_description":"出典：「光周波数掃引法による光回路素子の非破壊的内部診断・特性評価システムの構築」研究成果報告書　課題番号08555090\n(KAKEN：科学研究費助成事業データベース（国立情報学研究所）)\n　　　本文データは著者版報告書より作成","subitem_description_type":"Other"}]},"item_9_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24517/00053783","subitem_identifier_reg_type":"JaLC"}]},"item_9_publisher_17":{"attribute_name":"公開者","attribute_value_mlt":[{"subitem_publisher":"金沢大学理工研究域フロンティア工学系"}]},"item_9_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/search/?qm=90202837"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/search/?qm=90202837","subitem_relation_type_select":"URI"}},{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-08555090/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-08555090/","subitem_relation_type_select":"URI"}},{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/report/KAKENHI-PROJECT-08555090/085550901997kenkyu_seika_hokoku_gaiyo/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/report/KAKENHI-PROJECT-08555090/085550901997kenkyu_seika_hokoku_gaiyo/","subitem_relation_type_select":"URI"}}]},"item_9_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-03-15"}],"displaytype":"detail","filename":"TE-PR-IIYAMA-K-kaken 1998-89p.pdf","filesize":[{"value":"1.6 MB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"TE-PR-IIYAMA-K-kaken 1998-89p.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/47456/files/TE-PR-IIYAMA-K-kaken 1998-89p.pdf"},"version_id":"db108825-8064-42e4-b73f-fcdfa80caa6f"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"光周波数掃引法による光回路素子の非破壊的内部診断・特性評価システムの構築","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"光周波数掃引法による光回路素子の非破壊的内部診断・特性評価システムの構築"},{"subitem_title":"Development of nondestructive diagnosis of optical circuits by using a frequency-swept light source","subitem_title_language":"en"}]},"item_type_id":"9","owner":"18","path":["2836"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-03-15"},"publish_date":"2019-03-15","publish_status":"0","recid":"47456","relation_version_is_last":true,"title":["光周波数掃引法による光回路素子の非破壊的内部診断・特性評価システムの構築"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2023-07-27T14:49:45.452991+00:00"}