{"created":"2023-07-27T06:55:09.103802+00:00","id":50871,"links":{},"metadata":{"_buckets":{"deposit":"f1f0a9e1-afe3-46fb-aba5-e34ccb0594c8"},"_deposit":{"created_by":18,"id":"50871","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"50871"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00050871","sets":["2812:2813:2835"]},"author_link":["9766","92098"],"item_9_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1999-03","bibliographicIssueDateType":"Issued"},"bibliographicPageStart":"6p.","bibliographicVolumeNumber":"1997-1998","bibliographic_titles":[{"bibliographic_title":"平成10(1998)年度 科学研究費補助金 基盤研究(C) 研究成果報告書"},{"bibliographic_title":"1998 Fiscal Year Final Research Report","bibliographic_titleLang":"en"}]}]},"item_9_creator_33":{"attribute_name":"著者別表示","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{}],"nameIdentifiers":[{},{},{}]}]},"item_9_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"欠陥生成とランダムネスの関係を、共有結合半径の大きく異なるGeとCの原子からなる_<a->Ge_<1-x>C_x:H薄膜と共有結合半径の近いGeとSiの原子からなる_<a->Ge_<1-x>Si_x:H薄膜における欠陥生成の様子を比較することにより調べた。C添加の場合、共有結合半径の違いによるランダムネスの増加が大きいために、Ge原子1個当たりのGeダングリングボンド(DB)はxの増加と共に増加することを示した。\nさらに水素化アモルファスシリコンにおいて、Siダングリングボンド(DB)に対するスピン格子緩和時間T_1の光劣化に伴う変化を調べ、T_1はランダムネスに関係したアーバックエネルギーと良い相関があることを示した。光誘起ESR信号の幅の広い信号(BC)と幅の狭い信号(NC)に対するT_1は、DBに対するT_1とは異なり、光劣化と共に減少することを見出した。この知見はBCがフローティングボンド(FB)に起因するものかどうかを考える上でひとつの手がかりになるものと思われる。\n次にFBが介在したDBの生成モデルに基づいて、光照射や電子線照射による欠陥生成過程を総合的に説明することを試みた。FBとDBのペア生成とペア消滅、FBとDBの相互変換、およびFB間のペア消滅を考慮したレート方程式を用いて、先ず電子線照射の実験をシミュレートした。さらに照射エネルギーの相違を考慮して、FB-BDペア生成項を変えることによって、光劣化過程も統一的に説明できることを示した。熱平衡欠陥の生成過程およびアニール過程も同じレート方程式によって説明できる可能性が大きく、シミュレーションを続行中である。","subitem_description_type":"Abstract"},{"subitem_description":"Relation between the randomeness of amorphous network and the creation of defects was first investigated in an amorphous system of a-Ge_<1-x> C_x : H films which contains constituent atoms with largely different covalent radii, and compared the results with those in a-Ge_<1-x>Si_x, : H films which contains constituent atoms with close covalent radii. It. was found that the addition of C atoms makes the films stricture more random and increase the Ge dangling bonds per Ge atoms.\nNext we measured the spin-lattice relaxation time T_1 of Si dangling bonds and its dependence on the light-soaking time in a-Si : H.It was found that T_1 has a fairly good correlation with the randomness of the amorphous network estimated from the Urbach energy. It was also found that T_1's for the broad and narrow component signals of the light-induced ESR decreases by light-soaking, in contrast to that for the dark component. This might be an important clue to judge whether the origin of the broad component of the light-induced ESR comes from the floating bonds.\nFinally we tried to explain the defect creation processes by the light-soaking and electron-beam irradiation, using rate equations based on a model in which the floating bonds contribute to create dangling bonds.","subitem_description_type":"Abstract"}]},"item_9_description_22":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"研究課題/領域番号:09650010, 研究期間(年度):1997-1998","subitem_description_type":"Other"},{"subitem_description":"出典：「アモルファスシリコンの光劣化に対するフローティングボンドの寄与」研究成果報告書　課題番号09650010\n  (KAKEN：科学研究費助成事業データベース（国立情報学研究所）)\n　　　本文データは著者版報告書より作成","subitem_description_type":"Other"}]},"item_9_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24517/00057179","subitem_identifier_reg_type":"JaLC"}]},"item_9_publisher_17":{"attribute_name":"公開者","attribute_value_mlt":[{"subitem_publisher":"金沢大学自然科学研究科"}]},"item_9_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/search/?qm=30019773"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/search/?qm=30019773","subitem_relation_type_select":"URI"}},{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-09650010/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-09650010/","subitem_relation_type_select":"URI"}},{"subitem_relation_name":[{"subitem_relation_name_text":"https://kaken.nii.ac.jp/report/KAKENHI-PROJECT-09650010/096500101998kenkyu_seika_hokoku_gaiyo/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://kaken.nii.ac.jp/report/KAKENHI-PROJECT-09650010/096500101998kenkyu_seika_hokoku_gaiyo/","subitem_relation_type_select":"URI"}}]},"item_9_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-03-06"}],"displaytype":"detail","filename":"SC-PR-KUMEDA-M-kaken 1999-6p.pdf","filesize":[{"value":"162.3 kB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"SC-PR-KUMEDA-M-kaken 1999-6p.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/50871/files/SC-PR-KUMEDA-M-kaken 1999-6p.pdf"},"version_id":"ea0b9b32-a5e4-40ee-9dfb-04e670729e1e"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"research report","resourceuri":"http://purl.org/coar/resource_type/c_18ws"}]},"item_title":"アモルファスシリコンの光劣化に対するフローティングボンドの寄与","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"アモルファスシリコンの光劣化に対するフローティングボンドの寄与"},{"subitem_title":"Contribution of floating bonds to light-induced degradation of hydrogenated amorphous silicon","subitem_title_language":"en"}]},"item_type_id":"9","owner":"18","path":["2835"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-03-06"},"publish_date":"2020-03-06","publish_status":"0","recid":"50871","relation_version_is_last":true,"title":["アモルファスシリコンの光劣化に対するフローティングボンドの寄与"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2023-07-27T14:49:25.717364+00:00"}