{"created":"2023-07-27T06:59:09.653962+00:00","id":58452,"links":{},"metadata":{"_buckets":{"deposit":"ea4539ab-35b4-4177-b2be-e00875dc4846"},"_deposit":{"created_by":18,"id":"58452","owners":[18],"pid":{"revision_id":0,"type":"depid","value":"58452"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00058452","sets":["2438:4190:4191"]},"author_link":["102188","79673","79672","132","13263","91155"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2015","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5","bibliographicPageEnd":"N4","bibliographicPageStart":"N1","bibliographicVolumeNumber":"4","bibliographic_titles":[{"bibliographic_title":"ECS Solid State Letters"}]}]},"item_4_creator_33":{"attribute_name":"著者別表示","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"川江, 健"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"森本, 章治"}],"nameIdentifiers":[{},{},{},{}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We investigated the effects of a SrRuO3 (SRO) layer on the retention properties of (Bi, Pr)(Fe, Mn)O3 (BPFM) film capacitors under high temperature conditions. The dielectric constant of the BPFM film capacitor was increased by the introduction of the SRO layer. In addition, the Pt/BPFM/SRO/Pt capacitor showed polarization losses of only 6.4% in both polarization directions after a retention time of 104 s at 400°C, resulting in symmetrical switching behavior. These results imply that the introduction of the SRO layer is effective in suppression of the formation of an interfacial layer between BPFM and Pt. © 2015 The Electrochemical Society.","subitem_description_type":"Abstract"}]},"item_4_description_5":{"attribute_name":"提供者所属","attribute_value_mlt":[{"subitem_description":"金沢大学設計製造技術研究所 / 金沢大学理工研究域電子情報通信学系","subitem_description_type":"Other"}]},"item_4_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.24517/00064720","subitem_identifier_reg_type":"JaLC"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Electrochemical Society Inc."}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1149/2.0031505ssl","subitem_relation_type_select":"DOI"}}]},"item_4_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://ssl.ecsdl.org/"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://ssl.ecsdl.org/","subitem_relation_type_select":"URI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © Electrochemical Society Inc."}]},"item_4_source_id_11":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA12582714","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2162-8742","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"2162-8750","subitem_source_identifier_type":"ISSN"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Nomura, Keisuke"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kondo, Yuki"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kawae, Takeshi"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Morimoto, Akiharu"}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-01-20"}],"displaytype":"detail","filename":"TE-PR-MORIMOTO-A-N1.pdf","filesize":[{"value":"518.4 kB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"TE-PR-MORIMOTO-A-N1.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/58452/files/TE-PR-MORIMOTO-A-N1.pdf"},"version_id":"d5bc98e8-2c98-456f-a6ea-cd055f13b8bd"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Effects of SrRuO3 layer on retention properties of (Bi, Pr)(Fe, Mn)O3 film capacitor at high temperature","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Effects of SrRuO3 layer on retention properties of (Bi, Pr)(Fe, Mn)O3 film capacitor at high temperature"}]},"item_type_id":"4","owner":"18","path":["4191"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-01-20"},"publish_date":"2022-01-20","publish_status":"0","recid":"58452","relation_version_is_last":true,"title":["Effects of SrRuO3 layer on retention properties of (Bi, Pr)(Fe, Mn)O3 film capacitor at high temperature"],"weko_creator_id":"18","weko_shared_id":-1},"updated":"2023-07-27T10:10:59.084964+00:00"}