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Influence of copper vapor contamination on dielectric properties of hot air at 300-3500 K in atmospheric pressure
http://hdl.handle.net/2297/1850
http://hdl.handle.net/2297/1850c48242bc-5f77-42c1-8ba8-d3a0cff3ff8d
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
01453455.pdf (547.7 kB)
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| Item type | 学術雑誌論文 / Journal Article(1) | |||||
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| 公開日 | 2017-10-03 | |||||
| タイトル | ||||||
| タイトル | Influence of copper vapor contamination on dielectric properties of hot air at 300-3500 K in atmospheric pressure | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| 著者 |
Tanaka, Yasunori
× Tanaka, Yasunori |
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| 提供者所属 | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | 金沢大学工学部 | |||||
| 書誌情報 |
IEEE Transactions on Dielectrics and Electrical Insulation 巻 12, 号 3, p. 504-512, 発行日 2005-06-01 |
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| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 1070-9878 | |||||
| DOI | ||||||
| 関連タイプ | isIdenticalTo | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | https://doi.org/10.1109/tdei.2005.1453455 | |||||
| 出版者 | ||||||
| 出版者 | IEEE | |||||
| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | The influence of copper vapor contamination on the dielectric properties of hot air at atmospheric pressure was numerically predicted in heavy particle temperature range 300-3500 K. Dielectric properties of hot gases are very important for effective design of switching devices and other applications. Copper vapor is known to be injected from the electrodes into the hot gas during arc interruption in a circuit breaker, which may substantially affect the dielectric strength of the hot gas. Analysis of equilibrium composition for a hot air contaminated with copper vapor and computations of Boltzmann equation made it possible to study the dielectric properties of interest. The result indicates that 1.0% copper vapor contamination remarkably increases the effective ionization coefficient ᾱ and thereby decreases the critical electric field (E/N)cr drastically. This arises from a much lower ionization potential of the copper atom. © 2005 IEEE. | |||||
| 権利 | ||||||
| 権利情報 | ©2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.” IEEE Transactions on Dielectrics and Electrical Insulation 12 (3), 2005,pp. 504-512 | |||||
| 著者版フラグ | ||||||
| 出版タイプ | VoR | |||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
