{"created":"2023-07-27T06:24:33.574860+00:00","id":7513,"links":{},"metadata":{"_buckets":{"deposit":"a2847b3f-14a0-4c77-a48f-54d3ec842fe9"},"_deposit":{"created_by":3,"id":"7513","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"7513"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00007513","sets":["934:935:936"]},"author_link":["9757","9986","9985"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2001-12-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"12","bibliographicPageEnd":"1610","bibliographicPageStart":"1600","bibliographicVolumeNumber":"37","bibliographic_titles":[{"bibliographic_title":"IEEE J.Quantum Electron"}]}]},"item_4_description_16":{"attribute_name":"その他の識別子","attribute_value_mlt":[{"subitem_description":"AA00667423","subitem_description_type":"Other"}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A self-consistent numerical approach is demonstrated to analyze intensity and phase noise in semiconductor lasers. The approach takes into account the intrinsic fluctuations of the photon number, carrier number, and phase. A new systematic technique is proposed to generate the Langevin noise sources that derive the laser rate equations keeping their cross-correlations satisfied. The simulation is applied to AlGaAs lasers operating in a single mode. The time-varying profiles of the fluctuating photon and carrier numbers and the instantaneous shift of the oscillating frequency are presented. Statistical analysis of the intensity and phase fluctuations is given. The frequency spectra of intensity and phase noise are calculated with help of the fast Fourier transform. The importance of taking into account the carrier number noise source and its cross-correlation with the noise source on the phase is examined by comparing our results with those by conventional methods","subitem_description_type":"Abstract"}]},"item_4_description_5":{"attribute_name":"提供者所属","attribute_value_mlt":[{"subitem_description":"金沢大学大学院自然科学研究科","subitem_description_type":"Other"},{"subitem_description":"金沢大学工学部","subitem_description_type":"Other"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1109/3.970907","subitem_relation_type_select":"DOI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (C) 2001 IEEE.. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE..IEEE J.Quantum Electron　37(12),pp.1600-1610"}]},"item_4_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00189197","subitem_source_identifier_type":"ISSN"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Ahmed, Moustafa"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamada, Minoru"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Saito, Masayuki"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-10-03"}],"displaytype":"detail","filename":"TE-PR-YAMADA-M-2001JQE-Ahmed.pdf","filesize":[{"value":"317.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"TE-PR-YAMADA-M-2001JQE-Ahmed.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/7513/files/TE-PR-YAMADA-M-2001JQE-Ahmed.pdf"},"version_id":"b0c5078c-5ab5-415b-9f8a-2bdfe8e48ef1"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Numerical modeling of Intensity and phase noise in semiconductor lasers","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Numerical modeling of Intensity and phase noise in semiconductor lasers"}]},"item_type_id":"4","owner":"3","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-10-03"},"publish_date":"2017-10-03","publish_status":"0","recid":"7513","relation_version_is_last":true,"title":["Numerical modeling of Intensity and phase noise in semiconductor lasers"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-07-27T10:54:40.571268+00:00"}