{"created":"2023-07-27T06:25:20.731293+00:00","id":8604,"links":{},"metadata":{"_buckets":{"deposit":"4f79b0e2-2915-4a2e-98cb-5efb226f4085"},"_deposit":{"created_by":3,"id":"8604","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"8604"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00008604","sets":["934:935:936"]},"author_link":["399","12178","12179"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2012-01-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"12","bibliographicPageEnd":"1081","bibliographicPageStart":"1076","bibliographicVolumeNumber":"78","bibliographic_titles":[{"bibliographic_title":"精密工学会誌 = Journal of the Japan Society for Precision Engineering"}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Vertical-scanning shape-measurement interferometry using white light could not be used under vertically vibrating environment. Because, it is required to repeat predefined-length vertical movement with nanometer accuracy and interferogram capturing just after the movement. We developed the technology which can measure changes of optical path difference (OPD) of an interferometer at around 20-μs interval and can trigger interferogram exposure at even the moment when predefined-length movement complets irregularly due to external vibrations. But vibration during exposure does change interferogram intensities captured. This changes result in phase extraction errors and then shape measurement errors. Then we developed the phase-extraction method which utilizes the history of OPD change during exposure and might remove the above errors. In this paper, validity of this method is estimated by shape-measurement experiments using pulse-like vertical vibrations.","subitem_description_type":"Abstract"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"精密工学会 = Japan Society for Precision Engineering"}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.2493/jjspe.78.1076","subitem_relation_type_select":"DOI"}}]},"item_4_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.jspe.or.jp/","subitem_relation_type_select":"URI"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.jstage.jst.go.jp/browse/jjspe/-char/ja/","subitem_relation_type_select":"URI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 2012 The Japan Society for Precision Engineering 公益社団法人 精密工学会 | 許可を得て登録"}]},"item_4_source_id_11":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AN1003250X","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0912-0289","subitem_source_identifier_type":"ISSN"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"安達, 正明"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"佐部田, 龍佳"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"丹羽, 康人"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-10-03"}],"displaytype":"detail","filename":"TE-PR-ADACHI-M-1076.pdf","filesize":[{"value":"7.0 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"TE-PR-ADACHI-M-1076.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/8604/files/TE-PR-ADACHI-M-1076.pdf"},"version_id":"26624e28-d13e-48c6-bcdf-71d9f8f04de2"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"振動下で撮影された光干渉像を用いた高精度3次元形状計測","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"振動下で撮影された光干渉像を用いた高精度3次元形状計測"},{"subitem_title":"High-Precision 3D-Shape Measurement Using Interferograms Exposured Under Vertical Vibration","subitem_title_language":"en"}]},"item_type_id":"4","owner":"3","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-10-03"},"publish_date":"2017-10-03","publish_status":"0","recid":"8604","relation_version_is_last":true,"title":["振動下で撮影された光干渉像を用いた高精度3次元形状計測"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-07-28T02:06:50.666365+00:00"}