{"created":"2023-07-27T06:25:25.830221+00:00","id":8723,"links":{},"metadata":{"_buckets":{"deposit":"c082b64b-21f6-4550-a42e-7b9c2778578e"},"_deposit":{"created_by":3,"id":"8723","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"8723"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00008723","sets":["934:935:936"]},"author_link":["399"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2010-01-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"L09","bibliographicPageEnd":"752","bibliographicPageStart":"751","bibliographicVolumeNumber":"2010A","bibliographic_titles":[{"bibliographic_title":"精密工学会学術講演会講演論文集"}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"微細段差構造物の３Ｄ形状測定には多数枚のインコヒーレント干渉像を用いた位相抽出が行われる．しかし，光路差によってモジュレーションが異なる干渉縞を前提にした位相シフト法の提案は過去にほとんど無く，我々は新しい方法をコンピュータシミュレーションを用いて探し出している．この方法がどんな状況下で他の広く用いられている方法に対して効果的に働くかを実際にカメラで取り込んだハロゲン光干渉像を用いて検証した．","subitem_description_type":"Abstract"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"精密工学会 = The Japan Society for Precision Engineering"}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.11522/pscjspe.2010A.0.751.0","subitem_relation_type_select":"DOI"}}]},"item_4_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.jstage.jst.go.jp/browse/pscjspe/-char/ja/","subitem_relation_type_select":"URI"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.jspe.or.jp/","subitem_relation_type_select":"URI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © The Japan Society for Precision Engineering"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"安達, 正明"}],"nameIdentifiers":[{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-10-03"}],"displaytype":"detail","filename":"TE-PR-ADACHI-M-751.pdf","filesize":[{"value":"853.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"TE-PR-ADACHI-M-751.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/8723/files/TE-PR-ADACHI-M-751.pdf"},"version_id":"4c066277-1d5e-4719-8dc5-2773484d7773"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"ハロゲン光干渉像からの高精度位相抽出","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ハロゲン光干渉像からの高精度位相抽出"},{"subitem_title":"High-precision phase extraction from interferograms of a halogen lamp","subitem_title_language":"en"}]},"item_type_id":"4","owner":"3","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-10-03"},"publish_date":"2017-10-03","publish_status":"0","recid":"8723","relation_version_is_last":true,"title":["ハロゲン光干渉像からの高精度位相抽出"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-07-28T02:04:47.748773+00:00"}