@article{oai:kanazawa-u.repo.nii.ac.jp:00009226,
 author = {淺川, 雅 and 福間, 剛士 and Miyazawa, K. and Izumi, H. and Watanabe-Nakayama, T. and Asakawa, Hitoshi and Fukuma, Takeshi},
 issue = {10},
 journal = {Nanotechnology},
 month = {Feb},
 note = {Recently, possibilities of improving operation speed and force sensitivity in atomic-scale atomic force microscopy (AFM) in liquid using a small cantilever with an electron beam deposited (EBD) tip have been intensively explored. However, the structure and properties of an EBD tip suitable for such an application have not been well-understood and hence its fabrication process has not been established. In this study, we perform atomic-scale AFM measurements with a small cantilever and clarify two major problems: contaminations from a cantilever and tip surface, and insufficient mechanical strength of an EBD tip having a high aspect ratio. To solve these problems, here we propose a fabrication process of an EBD tip, where we attach a 2 μm silica bead at the cantilever end and fabricate a 500-700 nm EBD tip on the bead. The bead height ensures sufficient cantilever-sample distance and enables to suppress long-range interaction between them even with a short EBD tip having high mechanical strength. After the tip fabrication, we coat the whole cantilever and tip surface with Si (30 nm) to prevent the generation of contamination. We perform atomic-scale AFM imaging and hydration force measurements at a mica-water interface using the fabricated tip and demonstrate its applicability to such an atomic-scale application. With a repeated use of the proposed process, we can reuse a small cantilever for atomic-scale measurements for several times. Therefore, the proposed method solves the two major problems and enables the practical use of a small cantilever in atomic-scale studies on various solid-liquid interfacial phenomena., 金沢大学ナノ生命科学研究所},
 title = {Fabrication of electron beam deposited tip for atomic-scale atomic force microscopy in liquid},
 volume = {26},
 year = {2015}
}