{"created":"2023-07-27T06:25:48.757431+00:00","id":9264,"links":{},"metadata":{"_buckets":{"deposit":"f2588a68-8fdf-474e-89ca-1ada96501f7e"},"_deposit":{"created_by":3,"id":"9264","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"9264"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00009264","sets":["934:935:936"]},"author_link":["399","13284","13285"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2010-01-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"L14","bibliographicPageEnd":"756","bibliographicPageStart":"755","bibliographicVolumeNumber":"2010A","bibliographic_titles":[{"bibliographic_title":"精密工学会学術講演会講演論文集"}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"垂直走査型干渉顕微鏡を用いて振動下でも３Ｄ形状を測定する研究をしている．レーザ光を用い光路差を１５μｓ毎にサブｎｍ精度で計測し，所定移動量に達した時に位相シフト用干渉像を撮影する．しかし低コヒーレンス光源は光量に乏しくカメラの露光に数ｍｓかかる．その間に光路差が振動で変化した場合シフト誤差を受けてしまう．露光に数ｍｓかかっても，その間の光路差変化の情報を用いて位相を高精度に抽出する方法を検討した．","subitem_description_type":"Abstract"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"精密工学会 = The Japan Society for Precision Engineering"}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.11522/pscjspe.2010A.0.755.0","subitem_relation_type_select":"DOI"}}]},"item_4_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.jstage.jst.go.jp/browse/pscjspe/-char/ja/","subitem_relation_type_select":"URI"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.jspe.or.jp/","subitem_relation_type_select":"URI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © The Japan Society for Precision Engineering"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"岩尾, 雄太"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"丹羽, 康人"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"安達, 正明"}],"nameIdentifiers":[{},{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-10-03"}],"displaytype":"detail","filename":"TE-PR-ADACHI-M-755.pdf","filesize":[{"value":"462.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"TE-PR-ADACHI-M-755.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/9264/files/TE-PR-ADACHI-M-755.pdf"},"version_id":"09a4cf69-14b0-446e-a0c1-e750a81e55da"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"露光中の光路差変化情報を用いた低輝度光源干渉像からの位相抽出の高精度化","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"露光中の光路差変化情報を用いた低輝度光源干渉像からの位相抽出の高精度化"}]},"item_type_id":"4","owner":"3","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-10-03"},"publish_date":"2017-10-03","publish_status":"0","recid":"9264","relation_version_is_last":true,"title":["露光中の光路差変化情報を用いた低輝度光源干渉像からの位相抽出の高精度化"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-07-28T01:57:00.184729+00:00"}