{"created":"2023-07-27T06:25:54.722590+00:00","id":9406,"links":{},"metadata":{"_buckets":{"deposit":"2e8199c4-1b1f-44d7-9796-fd4b014d98df"},"_deposit":{"created_by":3,"id":"9406","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"9406"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00009406","sets":["934:935:936"]},"author_link":["399","13524","13385"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2003-01-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"B69","bibliographicPageEnd":"84","bibliographicPageStart":"84","bibliographicVolumeNumber":"2003A","bibliographic_titles":[{"bibliographic_title":"精密工学会学術講演会講演論文集"}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"我々の用いるスペックル干渉法では、カメラの各画素で個々に与えられる干渉光強度の最大値と最小値と、さらに変形測定が必要な時点の光強度から、逆余弦計算で位相値の候補となる情報をまず求め、局所領域では変形量が一定になることを利用して位相変化量を抽出する。しかし、粗面の変形が大きくなると、スペックル形状が激しく変化するため測定不能領域が生じる。今回はその測定不能領域の解決法を検討した結果ついて報告する。","subitem_description_type":"Abstract"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"精密工学会 = The Japan Society for Precision Engineering"}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.11522/pscjspe.2003A.0.104.0","subitem_relation_type_select":"DOI"}}]},"item_4_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.jstage.jst.go.jp/browse/pscjspe/-char/ja/","subitem_relation_type_select":"URI"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.jspe.or.jp/","subitem_relation_type_select":"URI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © The Japan Society for Precision Engineering"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"高山, 稔"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"安達, 正明"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"稲部, 勝幸"}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-10-03"}],"displaytype":"detail","filename":"TE-PR-ADACHI-M-84.pdf","filesize":[{"value":"61.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"TE-PR-ADACHI-M-84.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/9406/files/TE-PR-ADACHI-M-84.pdf"},"version_id":"4a80b952-2fbd-4e6d-853a-8f6318b3cb49"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"スペックル干渉計によるモジュレーション変動下での変形計測の改良","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"スペックル干渉計によるモジュレーション変動下での変形計測の改良"},{"subitem_title":"Improvement on Measurement of Large Changing Defomation Phase under Fluctuational Modulation of Speckle-Light Intensity Changes","subitem_title_language":"en"}]},"item_type_id":"4","owner":"3","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-10-03"},"publish_date":"2017-10-03","publish_status":"0","recid":"9406","relation_version_is_last":true,"title":["スペックル干渉計によるモジュレーション変動下での変形計測の改良"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-07-28T01:54:56.798071+00:00"}