{"created":"2023-07-27T06:25:54.807070+00:00","id":9408,"links":{},"metadata":{"_buckets":{"deposit":"6fb834e5-5eba-4acc-ba5d-ca5d1c9ec131"},"_deposit":{"created_by":3,"id":"9408","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"9408"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00009408","sets":["934:935:936"]},"author_link":["399","13528"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-01-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2013 JSPE Autumn Conference","bibliographicPageEnd":"388","bibliographicPageStart":"387","bibliographicVolumeNumber":"2013A","bibliographic_titles":[{"bibliographic_title":"精密工学会学術講演会講演論文集 = JSPE Conference"}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"振動環境下でも使える，波長走査干渉計を用いた３次元形状計測法を開発している．この実現には振動環境下で取り込んだ多数枚のスペックルグラムからスペックル位相を抽出する必要が有る．提案する方法では多数枚のスペックルグラムから，光強度の最大最小値探索と２回規格化を用いて，干渉像間の位相シフト量を抽出し，最小二乗近似を利用して位相を抽出する．","subitem_description_type":"Abstract"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"精密工学会 = The Japan Society for Precision Engineering"}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.11522/pscjspe.2013A.0.387.0","subitem_relation_type_select":"DOI"}}]},"item_4_relation_27":{"attribute_name":"シリーズ","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"H01"}]}]},"item_4_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.jstage.jst.go.jp/browse/pscjspe/-char/ja/","subitem_relation_type_select":"URI"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.jspe.or.jp/","subitem_relation_type_select":"URI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 精密工学会 The Japan Society for Precision Engineering"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"安達, 正明"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"佐々木, 裕紀"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-10-03"}],"displaytype":"detail","filename":"TE-PR-ADACHI-M-387.pdf","filesize":[{"value":"655.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"TE-PR-ADACHI-M-387.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/9408/files/TE-PR-ADACHI-M-387.pdf"},"version_id":"ff872e30-d1aa-4866-b302-004c4d3bc0e6"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"振動環境下で取り込まれた多数枚のスペックル干渉像からの位相抽出","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"振動環境下で取り込まれた多数枚のスペックル干渉像からの位相抽出"},{"subitem_title":"Phase extraction using many specklegrams captured under vertical vibration","subitem_title_language":"en"}]},"item_type_id":"4","owner":"3","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-10-03"},"publish_date":"2017-10-03","publish_status":"0","recid":"9408","relation_version_is_last":true,"title":["振動環境下で取り込まれた多数枚のスペックル干渉像からの位相抽出"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-07-28T01:54:53.699877+00:00"}