{"created":"2023-07-27T06:25:55.691317+00:00","id":9429,"links":{},"metadata":{"_buckets":{"deposit":"f30f215f-79b8-4641-971e-59b5bf076c2b"},"_deposit":{"created_by":3,"id":"9429","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"9429"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00009429","sets":["934:935:936"]},"author_link":["66629","66625","67","66626","66628","66627"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2015-01-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicPageEnd":"668","bibliographicPageStart":"661","bibliographicVolumeNumber":"135","bibliographic_titles":[{"bibliographic_title":"電気学会論文誌Ｂ (電力・エネルギー部門誌) = IEEJ Transactions on Power and Energy"}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper has proposed a new fundamental investigation technique on arc behaviors in decaying and re-ignition processes under gas flow condition. This technique utilizes power semiconductors like insulated-gate bipolar transistors (IGBTs) to control the arc current and voltage with a high accuracy in time domain. The free recovery condition was created by switching-on an IGBT connected in parallel with the arc device to investigate decaying process of the arc plasma under gas flow condition. Then, the quasi-transient recovery voltage (quasi-TRV) was intentionally applied between the electrodes in the arc device under the free recovery condition by turning-off the IGBT again, to study the re-ignition process of the arc plasma. At the same time, the arc behavior in a nozzle was observed by a high speed video camera at a frame rate of 200,000 fps. In the present work, arc behaviors in gas flow such as SF6 and CO2 in a nozzle was fundamentally investigated under free recovery condition and then after quasi-TRV application. In addition, the timing of the quasi-TRV application was changed to examine the recovery property of residual arcs in SF6 and CO2 gas flow. Through these experiments, the probability of arc successful interruptions were statistically measured for these gas flow arcs. These results provide fundamental data for comparison of the arc interruption capability of different conditions.","subitem_description_type":"Abstract"}]},"item_4_description_22":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"出版者照会後に全文公開","subitem_description_type":"Other"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電気学会 = Institute of Electrical Engineers of Japan"}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1541/ieejpes.135.661","subitem_relation_type_select":"DOI"}}]},"item_4_relation_28":{"attribute_name":"関連URI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.jstage.jst.go.jp/browse/ieejpes/-char/ja/","subitem_relation_type_select":"URI"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.iee.jp/","subitem_relation_type_select":"URI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 2015 by the Institute of Electrical Engineers of Japan"}]},"item_4_source_id_11":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AN10136334","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0385-4213","subitem_source_identifier_type":"ISSN"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Tanaka, Yasunori"}],"nameIdentifiers":[{"nameIdentifier":"67","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"90303263","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=90303263"},{"nameIdentifier":"90303263","nameIdentifierScheme":"金沢大学研究者情報","nameIdentifierURI":"http://ridb.kanazawa-u.ac.jp/public/detail.php?kaken=90303263"},{"nameIdentifier":"90303263","nameIdentifierScheme":"研究者番号","nameIdentifierURI":"https://nrid.nii.ac.jp/nrid/1000090303263"}]},{"creatorNames":[{"creatorName":"Nakano, Tomoyuki"}],"nameIdentifiers":[{"nameIdentifier":"66625","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Shimizu, Takahiro"}],"nameIdentifiers":[{"nameIdentifier":"66626","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tomita, Kentaro"}],"nameIdentifiers":[{"nameIdentifier":"66627","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Fujino, Takayasu"}],"nameIdentifiers":[{"nameIdentifier":"66628","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Suzuki, Katsumi"}],"nameIdentifiers":[{"nameIdentifier":"66629","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"9999-12-31"}],"displaytype":"detail","filename":"TE-PR-TANAKA-Y-661.pdf","filesize":[{"value":"2.1 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"TE-PR-TANAKA-Y-661.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/9429/files/TE-PR-TANAKA-Y-661.pdf"},"version_id":"b1552299-a8be-41a3-806e-f3f1f9af343b"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Fundamental Investigation Technique on Gas-blast Arc Behaviors in Decaying and Re-ignition Processes using Power Semiconductors","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Fundamental Investigation Technique on Gas-blast Arc Behaviors in Decaying and Re-ignition Processes using Power Semiconductors"}]},"item_type_id":"4","owner":"3","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-11-09"},"publish_date":"2017-11-09","publish_status":"0","recid":"9429","relation_version_is_last":true,"title":["Fundamental Investigation Technique on Gas-blast Arc Behaviors in Decaying and Re-ignition Processes using Power Semiconductors"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-06-20T06:13:39.564091+00:00"}