{"created":"2023-07-27T06:25:58.544704+00:00","id":9497,"links":{},"metadata":{"_buckets":{"deposit":"d47f4307-adbc-45f5-aa0c-cc1d389d0e7b"},"_deposit":{"created_by":3,"id":"9497","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"9497"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00009497","sets":["934:935:936"]},"author_link":["13706","11069","13704","13705","11068"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2001-07-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"2012","bibliographicPageStart":"2010","bibliographicVolumeNumber":"37","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Maggetics"}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper presents a novel eddy-current testing (ECT) sensor for the inspection of printed circuit board (PCB), which detects trace damages on PCB conductors. The sensor is composed of a meander-exciting coil and three solenoid pick-up coils. Application of three pick-up coils increases the speed of the inspection process. Information about defects can be extracted either from an amplitude or a phase of a signal obtained during the inspection. A visualization process was provided using the amplitude data. In this paper the structure of the ECT sensor and principles of detection as well as experimental results are presented.","subitem_description_type":"Abstract"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Institute of Electrical and Electronics Engineers IEEE"}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/20.951037","subitem_relation_type_select":"DOI"}}]},"item_4_source_id_11":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA00667933","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0018-9464","subitem_source_identifier_type":"ISSN"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kacprzak, D."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Taniguchi, T."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nakamura, N."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yamada, Sotoshi"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Iwahara, Masayoshi"}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-10-03"}],"displaytype":"detail","filename":"TE-PR-YAMADA-S-182.pdf","filesize":[{"value":"234.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"TE-PR-YAMADA-S-182.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/9497/files/TE-PR-YAMADA-S-182.pdf"},"version_id":"72c211d6-26f1-489c-8c48-062eb64270fc"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Novel Eddy Current Testing Sensor for the Inspection of Printed Circuit Boards","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Novel Eddy Current Testing Sensor for the Inspection of Printed Circuit Boards"}]},"item_type_id":"4","owner":"3","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-10-03"},"publish_date":"2017-10-03","publish_status":"0","recid":"9497","relation_version_is_last":true,"title":["Novel Eddy Current Testing Sensor for the Inspection of Printed Circuit Boards"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-07-28T01:53:37.886015+00:00"}