{"created":"2023-07-27T06:25:59.715194+00:00","id":9525,"links":{},"metadata":{"_buckets":{"deposit":"ef78322d-3751-42b4-b147-1ef71075839c"},"_deposit":{"created_by":3,"id":"9525","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"9525"},"status":"published"},"_oai":{"id":"oai:kanazawa-u.repo.nii.ac.jp:00009525","sets":["934:935:936"]},"author_link":["11069","13757","13758","11068"],"item_4_biblio_info_8":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1995-11-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"6","bibliographicPageEnd":"3187","bibliographicPageStart":"3185","bibliographicVolumeNumber":"31","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Maggetics"}]}]},"item_4_description_21":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper presents a new eddy-current probe composed of a micro-planar mesh coil and meander coil. The probe can be used to detect the existence and the size of cracks in metallic structures. Experimental results for the sensed output voltage of this device are presented. The output signal is shown to have a discrete nature. Also, the results show that the signal strength is weak and that an offset voltage exists. Improved probe characteristics are obtained by connecting two mesh coils in series, stacking the coils on top of each other and orienting the two coils 180° apart.","subitem_description_type":"Abstract"}]},"item_4_publisher_17":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Institute of Electrical and Electronics Engineers IEEE"}]},"item_4_relation_12":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/20.490322","subitem_relation_type_select":"DOI"}}]},"item_4_rights_23":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 1995 IEEE"}]},"item_4_source_id_11":{"attribute_name":"NCID","attribute_value_mlt":[{"subitem_source_identifier":"AA00667933","subitem_source_identifier_type":"NCID"}]},"item_4_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0018-9464","subitem_source_identifier_type":"ISSN"}]},"item_4_version_type_25":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yamada, Sotoshi"}],"nameIdentifiers":[{},{},{}]},{"creatorNames":[{"creatorName":"Katou, M."}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Iwahara, Masayoshi"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Dawson, F.P."}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-10-03"}],"displaytype":"detail","filename":"TE-PR-YAMADA-S-092.pdf","filesize":[{"value":"288.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"TE-PR-YAMADA-S-092.pdf","url":"https://kanazawa-u.repo.nii.ac.jp/record/9525/files/TE-PR-YAMADA-S-092.pdf"},"version_id":"a036b423-04c4-4530-ab71-0b4a19766688"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Eddy Current Testing Probe Composed of Planar Coils","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Eddy Current Testing Probe Composed of Planar Coils"}]},"item_type_id":"4","owner":"3","path":["936"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-10-03"},"publish_date":"2017-10-03","publish_status":"0","recid":"9525","relation_version_is_last":true,"title":["Eddy Current Testing Probe Composed of Planar Coils"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-07-28T01:53:02.583570+00:00"}