@article{oai:kanazawa-u.repo.nii.ac.jp:00009898,
 author = {安井, 治之 and 広瀬, 幸雄 and 佐々木, 敏彦 and 粟津, 薫 and 楢本, 洋},
 issue = {7},
 journal = {材料=Journal of the Society of Materials Science, Japan},
 month = {Jul},
 note = {Hydrogen is a very common contaminant in carbon films. It can strongly influence on mechanical, physical and chemical properties of the films. The analysis of hydrogen is therefore a crucial problem produce the films with the properties required. Ion beam techniques using nuclear reactions are effective for the quantitative determination of hydrogen concentration. A specially designed spectrometer is employed for the detailed determination of hydrogen concentrations by detecting 4.43MeV γ-rays from the resonant nuclear reactions ^1H(^15N, αγ)^12C at the 6.385MeV. In this study, the BCN films were formed on silicon substrate by ion beam assisted deposition (IBAD), in which boron and carbon were deposited by electron beam heating of B_4C solid and nitrogen was supplied by ion implantation simultaneously. The concentrations of hydrogen in BCN films were measured using RNRA. The mechanical properties of BCN films were evaluated using an ultra-micro-hardness tester. It was confiremed that the hardness of BCN films increased with increasing the concentration of hydrogen., 金沢大学大学院自然科学研究科},
 pages = {727--731},
 title = {共鳴核反応分析法によるBCN膜の水素量測定(<特集>X線材料強度)},
 volume = {50},
 year = {2001}
}