@article{oai:kanazawa-u.repo.nii.ac.jp:00009919,
 author = {江尻, 正一 and 後藤, 昌英 and 佐々木, 敏彦 and 広瀬, 幸雄},
 issue = {8},
 journal = {材料 = Journal of the Society of Materials Science, Japan},
 month = {Aug},
 note = {The X-ray stress measurement is an effective method of nondestructive inspection for the residual stress in the surface layer of steel materials. However, the sin^2 ψ method, which is commonly used as X-ray stress measurement, is inapplicable to such anisotropic materials as textured materials because the theory supposes isotropic elastic polycrystalline materials as sample. The applicable X-ray stress measurement to textured materials was investigated on the assumption that information about each crystallite orientation was deduced by crystallite orientation distribution (ODF). Applied to measure the stress of the titanium carbide nitride (TiCN) film with the <111> preferred orientation, the residual stress value was determined from the measured lattice strain. The strong compressive stress value was observed in the film. Compared with methods of other models, the result indicated a small difference from the <111> ideal fiber texture model and was situated between the texture model and sin^2 ψ method., 金沢大学大学院自然科学研究科（工学系）},
 pages = {881--886},
 title = {結晶方位分布関数を用いたTiCN配向膜のX線応力測定},
 volume = {54},
 year = {2005}
}