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電子空乏化を用いた半導体光変調器の動作機構解析
https://doi.org/10.24517/00058221
https://doi.org/10.24517/00058221b0fcffd7-6263-46ab-8130-d678708581f5
名前 / ファイル | ライセンス | アクション |
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TE-PR-KUWAMURA-Y-616.pdf (638.9 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2020-05-15 | |||||
タイトル | ||||||
タイトル | 電子空乏化を用いた半導体光変調器の動作機構解析 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Analysis of Operating Mechanism in Semiconductor Optical Modulator with Electron Depleting Absorption Control | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
ID登録 | ||||||
ID登録 | 10.24517/00058221 | |||||
ID登録タイプ | JaLC | |||||
著者 |
桑村, 有司
× 桑村, 有司× 山田, 実× 橋本, 晋 |
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著者別表示 |
Kuwamura, Yuji
× Kuwamura, Yuji× Yamada, Minoru× Hashimoto, Susumu |
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提供者所属 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 金沢大学工学部電子情報工学科/Department of Electrical and Computer Engineering, Faculty of Engineering, Kanazawa University | |||||
書誌情報 |
電子情報通信学会論文誌. C-I, エレクトロニクス, I-光・波動 en : The transactions of the Institute of Electronics, Information and Communication Engineers 巻 J78-C-1, 号 12, p. 616-625, 発行日 1995-12-25 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0915-1893 | |||||
NCID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AN10071283 | |||||
出版者 | ||||||
出版者 | 電子情報通信学会 IEICE | |||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | 電子空乏化を用いた半導体光変調器中の光吸収動作機構について理論的および実験的に検討した.不純物を添加した直接遷移形半導体中では,電子を空乏化すると光吸収量が増加する.電子空乏化された領域では,1)伝導帯電子数や価電子帯正孔数の減少,2)スクリーニング効果の減少による不純物エネルギー準位の移動,3)内部電界強度の増加により,バンド-バンド間電子遷移確率が増大する.これらの三つの現象の相乗効果で変調器中の光吸収量が増大する. | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | Embargo Period 12 months | |||||
権利 | ||||||
権利情報 | Copyright © 電子情報通信学会 IEICE | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
関連URI | ||||||
識別子タイプ | URI | |||||
関連識別子 | https://www.ieice.org/jpn_r/ | |||||
関連名称 | https://www.ieice.org/jpn_r/ | |||||
関連URI | ||||||
識別子タイプ | URI | |||||
関連識別子 | https://ci.nii.ac.jp/naid/110003307617 | |||||
関連名称 | https://ci.nii.ac.jp/naid/110003307617 |