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Improvements in fundamental performance of liquid-environment atomic force microscopy with true atomic resolution
https://doi.org/10.24517/00010772
https://doi.org/10.24517/00010772fa032dbc-ea8d-4b63-9f35-f5b7bea6d8c1
名前 / ファイル | ライセンス | アクション |
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Item type | 学術雑誌論文 / Journal Article(1) | |||||||||
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公開日 | 2017-10-03 | |||||||||
タイトル | ||||||||||
タイトル | Improvements in fundamental performance of liquid-environment atomic force microscopy with true atomic resolution | |||||||||
言語 | ||||||||||
言語 | eng | |||||||||
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資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||
資源タイプ | journal article | |||||||||
ID登録 | ||||||||||
ID登録 | 10.24517/00010772 | |||||||||
ID登録タイプ | JaLC | |||||||||
著者 |
Miyata, Kazuki
× Miyata, Kazuki× Miyazawa, Keisuke× Reza Akrami, Seyed Mohammad× Fukuma, Takeshi |
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著者別表示 |
宮田, 一輝
× 宮田, 一輝
× 福間, 剛士
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提供者所属 | ||||||||||
内容記述タイプ | Other | |||||||||
内容記述 | 金沢大学ナノ生命科学研究所 | |||||||||
書誌情報 |
Japanese Journal of Applied Physics 巻 54, 号 8, p. 08LA03, 発行日 2015-08-01 |
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ISSN | ||||||||||
収録物識別子タイプ | ISSN | |||||||||
収録物識別子 | 0021-4922 | |||||||||
NCID | ||||||||||
収録物識別子タイプ | NCID | |||||||||
収録物識別子 | AA11906093 | |||||||||
DOI | ||||||||||
関連タイプ | isVersionOf | |||||||||
識別子タイプ | DOI | |||||||||
関連識別子 | 10.7567/JJAP.54.08LA03 | |||||||||
出版者 | ||||||||||
出版者 | 応用物理学会 = Japan Society of Applied Physics | |||||||||
抄録 | ||||||||||
内容記述タイプ | Abstract | |||||||||
内容記述 | Recently, there have been significant advancements in liquid-environment atomic force microscopy (AFM) with true atomic resolution. The technical advancements are followed by a rapid expansion of its application area. Examples include subnanometer-scale imaging of biological systems and three-dimensional measurements of water distributions (i.e., hydration structures) and fluctuating surface structures. However, to continue this progress, we should improve the fundamental performance of liquid-environment dynamic-mode AFM. The present AFM technique does not allow real-time imaging of atomic-scale dynamic phenomena at a solid-liquid interface. This has hindered atomic-level understanding of crystal growth and dissolution, catalytic reactions and metal corrosion processes. Improvement in force sensitivity is required not only for such a high-speed imaging but also for various surface property measurements using a high-resolution AFM technique. In this review, we summarize recent works on the improvements in the force sensitivity and operation speed of atomic-resolution dynamic-mode AFM for liquid-environment applications. © 2015 The Japan Society of Applied Physics. | |||||||||
内容記述 | ||||||||||
内容記述タイプ | Other | |||||||||
内容記述 | Embargo Period 12 months | |||||||||
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出版タイプ | AM | |||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||||
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識別子タイプ | URI | |||||||||
関連識別子 | https://www.jsap.or.jp/index.html |