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熱処理ポリアクリロニトリル半導体の交流特性におよぼす200℃付近の加熱過程の影響
https://doi.org/10.24517/00011752
https://doi.org/10.24517/00011752deab7fb4-dedb-4874-90cf-28c3a27e4c38
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
AN00044309-8-2-105.pdf (176.2 kB)
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| アイテムタイプ | 紀要論文 / Departmental Bulletin Paper(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2017-10-03 | |||||
| タイトル | ||||||
| タイトル | 熱処理ポリアクリロニトリル半導体の交流特性におよぼす200℃付近の加熱過程の影響 | |||||
| タイトル | ||||||
| タイトル | Effects of Heating-Process around 200℃ on AC Characteristics of Pyrolyzed Polyacrylonitrile Semiconductor | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | jpn | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | departmental bulletin paper | |||||
| ID登録 | ||||||
| ID登録 | 10.24517/00011752 | |||||
| ID登録タイプ | JaLC | |||||
| 著者 |
伊藤, 清一
× 伊藤, 清一× 越田, 逸朗× 今崎, 一雄× 定村, 茂 |
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| 著者別表示 |
Ito, Seiichi
× Ito, Seiichi× Koshita, Itsuro× Imazaki, Kazuo× Jomura, Shigeru |
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| 書誌情報 |
金沢大学工学部紀要 = Memoirs of the Faculty of Technology Kanazawa University 巻 8, 号 2, p. 105-113, 発行日 1974-09-25 |
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| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 0022-832X | |||||
| NCID | ||||||
| 収録物識別子タイプ | NCID | |||||
| 収録物識別子 | AN00044309 | |||||
| 出版者 | ||||||
| 出版者 | 金沢大学工学部 = Faculty of Technology Kanazawa University | |||||
| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | It is well know that polyacrylonitrile is turned into a semiconductor by the adequate pyrolysis to 500~600℃;this is mainly attributed to formation of conjugated chains throughout the specimen. But, of all the pyrolysis processes, the one around 200℃ is particularly important to get a desirable character of electric conductivity and mechanical strength. Therefore in this report, two kinds of specimen were prepared under the different rates of temperature rise around 200℃. Then, their AC characteristics were measured in the temperature range from room temperature to about 120℃at frequencies from 1 kHz to 1 MHz. In conclusion, the contraction of the heating time around 200℃results in increases of effective resistance and capacitance, and their increases are interpreted as those especially in the boundary of the specimen on the basis of equivalent circuit which was previously presented by one of the authors. | |||||
| 著者版フラグ | ||||||
| 出版タイプ | VoR | |||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
