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Submolecular-scale investigations on metal-phthalocyanine monolayers by frequency modulation atomic force microscopy
http://hdl.handle.net/2297/21292
http://hdl.handle.net/2297/212924358f764-8ff5-4f86-b98d-92404c1eb903
| 名前 / ファイル | ライセンス | アクション |
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FR-PR-FUKUMA-T-24315.pdf (363.8 kB)
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| Item type | 学術雑誌論文 / Journal Article(1) | |||||||
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| 公開日 | 2017-10-06 | |||||||
| タイトル | ||||||||
| タイトル | Submolecular-scale investigations on metal-phthalocyanine monolayers by frequency modulation atomic force microscopy | |||||||
| 言語 | ||||||||
| 言語 | eng | |||||||
| 資源タイプ | ||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||
| 資源タイプ | journal article | |||||||
| 著者 |
Ichii, Takashi
× Ichii, Takashi× Fukuma, Takeshi× Yoda, Tadashi× Kobayashi, Kei× Matsushige, Kazumi× Yamada, Hirofumi |
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| 著者別表示 |
福間, 剛士
× 福間, 剛士
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| 提供者所属 | ||||||||
| 内容記述タイプ | Other | |||||||
| 内容記述 | 金沢大学フロンティアサイエンス機構 | |||||||
| 書誌情報 |
Journal of Applied Physics 巻 107, 号 2, p. 24315, 発行日 2010-01-01 |
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| ISSN | ||||||||
| 収録物識別子タイプ | ISSN | |||||||
| 収録物識別子 | 0021-8979 | |||||||
| NCID | ||||||||
| 収録物識別子タイプ | NCID | |||||||
| 収録物識別子 | AA00693547 | |||||||
| DOI | ||||||||
| 関連タイプ | isIdenticalTo | |||||||
| 識別子タイプ | DOI | |||||||
| 関連識別子 | 10.1063/1.3284094 | |||||||
| 出版者 | ||||||||
| 出版者 | American Institute of Physics | |||||||
| 抄録 | ||||||||
| 内容記述タイプ | Abstract | |||||||
| 内容記述 | Copper-phthalocyanine (CuPc) monolayers and cobalt-phthalocyanine monolayers deposited on Au(111) surfaces were investigated by frequency modulation atomic force microscopy (FM-AFM). Submolecular-resolution topographic images were successfully obtained for both samples. Despite the similar molecular geometry of the two molecules, they showed clearly different contrasts in the topographic images. The origin of the contrast is discussed in terms of the relationship of the molecular orbitals and the chemical interaction between the tip and the molecules. In addition, a molecular-resolution surface potential (SP) image was obtained on CuPc monolayers using Kelvin probe force microscopy (KFM) utilizing FM-AFM. The molecular-scale SP contrast was explained by the electric dipole moment at the organic/metal interface. This result suggested the possibility of the detection of the single molecular dipole moment by KFM. © 2010 American Institute of Physics. | |||||||
| 著者版フラグ | ||||||||
| 出版タイプ | VoR | |||||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||
| 関連URI | ||||||||
| 識別子タイプ | URI | |||||||
| 関連識別子 | http://jap.aip.org/japiau/v107/i2/p024315_s1 | |||||||
