Item type |
学術雑誌論文 / Journal Article(1) |
公開日 |
2018-04-16 |
タイトル |
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タイトル |
Evaluation of arc quenching characteristics of various gases using power semiconductors |
言語 |
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言語 |
eng |
資源タイプ |
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資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
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資源タイプ |
journal article |
ID登録 |
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ID登録 |
10.24517/00050511 |
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ID登録タイプ |
JaLC |
著者 |
Nakano, Tomoyuki
Tanaka, Yasunori
Murai, Kosuke
Uesugi, Yoshihiko
Ishijima, Tatsuo
Tomita, Kensuke
Suzuki, Katsumi
Shinkai, Takeshi
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著者別表示 |
田中, 康規
上杉, 喜彦
石島, 達夫
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提供者所属 |
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内容記述タイプ |
Other |
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内容記述 |
金沢大学理工研究域電子情報学系 |
書誌情報 |
Journal of Physics D: Applied Physics
巻 50,
号 48,
p. 485602,
発行日 2017-11-07
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ISSN |
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収録物識別子タイプ |
ISSN |
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収録物識別子 |
0022-3727 |
NCID |
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収録物識別子タイプ |
NCID |
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収録物識別子 |
AA00704905 |
DOI |
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関連タイプ |
isVersionOf |
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識別子タイプ |
DOI |
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関連識別子 |
10.1088/1361-6463/aa8f8a |
出版者 |
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出版者 |
Institute of Physics Publishing |
抄録 |
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内容記述タイプ |
Abstract |
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内容記述 |
This paper presents the arc quenching abilities of various gases studied using a power semiconductor switching technique. The technique uses an insulated gate bi-polar transistor (IGBT) to inject current and apply voltage to the plasma arc. Using this technique, arcs in free recovery condition after a 50 A steady state condition were investigated in SF6, CO2, O2, N2, air and Ar gas flows. Furthermore, at a specific time high voltages of about 1.1 kV and 1.7 kV μ were applied to the residual decaying arcs by the IGBT to elucidate the arc re-ignition process and recovery properties. These systematic experiments further enabled us to estimate the interruption probability versus the voltage application time. From these results, the voltage application time for 50% successful interruption was estimated for various gases, with the results showing a direct relation to the interruption capabilities of the respective gases. These results were then compared to the electron density measurement results and numerical simulation results to confirm their validity. All data obtained from the experiments and simulation is expected to be useful for elucidating the arc quenching physics and also for the practical application of arc quenching phenomena. © 2017 IOP Publishing Ltd. |
内容記述 |
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内容記述タイプ |
Other |
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内容記述 |
Embargo Period 12 months |
権利 |
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権利情報 |
Copyright © 2017 IOP Publishing Ltd |
著者版フラグ |
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出版タイプ |
AM |
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出版タイプResource |
http://purl.org/coar/version/c_ab4af688f83e57aa |