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Three-dimensional object profiling using highly accurate FMCW optical ranging system
https://doi.org/10.24517/00059005
https://doi.org/10.24517/00059005a254177c-ae21-4f1c-9c51-6703ecbda96a
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
TE-PR-IIYAMA-K-IEEE-3826.pdf (1.5 MB)
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| アイテムタイプ | 学術雑誌論文 / Journal Article(1) | |||||||
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| 公開日 | 2020-08-07 | |||||||
| タイトル | ||||||||
| タイトル | Three-dimensional object profiling using highly accurate FMCW optical ranging system | |||||||
| 言語 | en | |||||||
| 言語 | ||||||||
| 言語 | eng | |||||||
| 資源タイプ | ||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||
| 資源タイプ | journal article | |||||||
| ID登録 | ||||||||
| ID登録 | 10.24517/00059005 | |||||||
| ID登録タイプ | JaLC | |||||||
| 著者 |
Ula, Rini Khamimatul
× Ula, Rini Khamimatul× Noguchi, Yusuke× Iiyama, Koichi |
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| 著者別表示 |
飯山, 宏一
× 飯山, 宏一
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| 提供者所属 | ||||||||
| 内容記述タイプ | Other | |||||||
| 内容記述 | 金沢大学理工研究域フロンティア工学系 | |||||||
| 書誌情報 |
Journal of Lightwave Technology 巻 37, 号 15(8732446), p. 3826-3833, 発行日 2019-08-01 |
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| ISSN | ||||||||
| 収録物識別子タイプ | ISSN | |||||||
| 収録物識別子 | 0733-8724 | |||||||
| NCID | ||||||||
| 収録物識別子タイプ | NCID | |||||||
| 収録物識別子 | AA10453426 | |||||||
| DOI | ||||||||
| 関連タイプ | isVersionOf | |||||||
| 識別子タイプ | DOI | |||||||
| 関連識別子 | 10.1109/JLT.2019.2921353 | |||||||
| 出版者 | ||||||||
| 出版者 | IEEE | |||||||
| 抄録 | ||||||||
| 内容記述タイプ | Abstract | |||||||
| 内容記述 | We have developed three-dimensional object profiling system using a highly accurate frequency-modulated continuous-wave optical ranging system. A DFB laser and a vertical-cavity surface-emitting laser (VCSEL) are used as the laser source and the optical frequency is swept by the injection current modulation with a symmetric triangular wave. The influence of nonlinearity in the optical frequency sweep is canceled by utilizing k-sampling technique. Since the optical frequency sweep range of a VCSEL is larger than that of a DFB laser, high spatial resolution and high ranging accuracy are achieved by using a VCSEL. The spatial resolution evaluated by the full-width at half-maximum (FWHM) is 460 μm and the standard deviation of the ranging accuracy is σ = 2.7, μm when a VCSEL is used as the frequency-swept laser source, and the FWHM is 2.3 mm and σ = 14.8 μ m when a DFB laser is used as the frequency-swept laser source. Accordingly, fine and clear object profiling of a coin and a printed circuit board is achieved by using a VCSEL as the frequency-swept laser source. Finally, we speed up the measurement time by increasing the repetition frequency of the injection current modulation and optimizing timing of the data acquisition, the galvano mirror scan and the fast Fourier transform analysis by taking account of the transient response of the galvano mirror, and the fastest measurement time of 22.6 s is achieved for 201 × 201 measurement points, which is four times faster than our previous results. We also discuss the effect of moving average filtering and median filtering to improve profiling quality. | |||||||
| 権利 | ||||||||
| 権利情報 | Copyright © IEEE | |||||||
| 著者版フラグ | ||||||||
| 出版タイプ | AM | |||||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||
| 関連URI | ||||||||
| 関連タイプ | isVersionOf | |||||||
| 識別子タイプ | URI | |||||||
| 関連識別子 | https://ieeexplore.ieee.org/document/8732446 | |||||||
