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Ni-Co-P/α-Si_3N_4複合めっき材のX線応力測定 : 応力勾配を考慮したNi-Co-P相の残留応力測定(<特集>X線材料強度)
http://hdl.handle.net/2297/12317
http://hdl.handle.net/2297/12317eca0ab8a-72cf-4f1a-bc98-0a5b6ccd3ad1
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
TE-PR-HIROSE-Y-760.pdf (704.4 kB)
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| Item type | 学術雑誌論文 / Journal Article(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 2017-10-03 | |||||
| タイトル | ||||||
| タイトル | Ni-Co-P/α-Si_3N_4複合めっき材のX線応力測定 : 応力勾配を考慮したNi-Co-P相の残留応力測定(<特集>X線材料強度) | |||||
| タイトル | ||||||
| タイトル | X-Ray Stress Measurement of Composite Plating (Ni-Co-P/α-Si_3N_4) : Residual Stress Measurement of Ni-Co-P Phase under the Consideration of the Stress Gradient(Special Issue on X-Ray Study on Deformation and Fracture of Solid) | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | jpn | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| 著者 |
増田, 秀夫
× 増田, 秀夫× 鷹合, 滋樹× 比良, 光善× 広瀬, 幸雄 |
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| 提供者所属 | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | 金沢大学大学院自然科学研究科 | |||||
| 書誌情報 |
材料=Journal of the Society of Materials Science, Japan 巻 49, 号 7, p. 760-765, 発行日 2000-07-15 |
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| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 0514-5163 | |||||
| NCID | ||||||
| 収録物識別子タイプ | NCID | |||||
| 収録物識別子 | AN00096175 | |||||
| 出版者 | ||||||
| 出版者 | 日本材料学会 | |||||
| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | Ni-Co-P/α-Si_3N_4 composite plating excels in wear-and corrosion resistance. It is important to evaluate the residual stress due to the misfit of mechanical and physical properties between plating and substrate during the manufacturing and industrial using. However, in the case of plating specimen which have stress gradient, the sin^2Ψ method is not adequate to use because this material shows severely curved sin^2Ψ diagram. In this study, a fundamental investigation was carried out to apply the X-ray residual stress measurement of the plating material. Fourth kinds of specimens with different thickness of film were prepared. X-ray elastic constants were obtained using the non-liner analysis. Influence of the film thickness on curvature of 2θ-sin^2Ψ diagram was simulated. Residual stress in the plating layer was analyzed under the assumption that the stress state is equivalent biaxial. Some experimental results were observed: sin^2Ψ diagrams were severely curved, and shape of diagrams shows varied by the film thickness and X-ray penetration depth. There is the steep stress gradient in the direction of depth. As the results, X-ray elastic constants of all specimens were independent from the thickness of film. Therefore, the value is constantly. A value of residual compressive stress calculated form present method is grater than value of sin^2Ψ technique. Compressive stress decreased with the film thickness. | |||||
| 権利 | ||||||
| 権利情報 | 日本材料学会；本文データは日本材料学会の許諾に基づきCiNiiから複製したものである | |||||
| 著者版フラグ | ||||||
| 出版タイプ | VoR | |||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
| 関連URI | ||||||
| 識別子タイプ | URI | |||||
| 関連識別子 | http://ci.nii.ac.jp/naid/110002294032/ | |||||
