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Advanced instrumentation of frequency modulation AFM for subnanometer-scale 2D/3D measurements at solid-liquid interfaces
https://doi.org/10.24517/00009133
https://doi.org/10.24517/00009133b175bef2-e748-44a9-aabf-95b9b5ace9d2
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
TE-PR-FUKUMA-T-435.pdf (933.0 kB)
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| Item type | 学術雑誌論文 / Journal Article(1) | |||||||
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| 公開日 | 2017-10-03 | |||||||
| タイトル | ||||||||
| タイトル | Advanced instrumentation of frequency modulation AFM for subnanometer-scale 2D/3D measurements at solid-liquid interfaces | |||||||
| 言語 | ||||||||
| 言語 | eng | |||||||
| 資源タイプ | ||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||
| 資源タイプ | journal article | |||||||
| ID登録 | ||||||||
| ID登録 | 10.24517/00009133 | |||||||
| ID登録タイプ | JaLC | |||||||
| 著者 |
Fukuma, Takeshi
× Fukuma, Takeshi |
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| 著者別表示 |
福間, 剛士
× 福間, 剛士
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| 提供者所属 | ||||||||
| 内容記述タイプ | Other | |||||||
| 内容記述 | 金沢大学ナノ生命科学研究所 | |||||||
| 書誌情報 |
NanoScience and Technology 巻 97, p. 435-460, 発行日 2015-01-01 |
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| ISSN | ||||||||
| 収録物識別子タイプ | ISSN | |||||||
| 収録物識別子 | 1434-4904 | |||||||
| DOI | ||||||||
| 関連タイプ | isVersionOf | |||||||
| 識別子タイプ | DOI | |||||||
| 関連識別子 | 10.1007/978-3-319-15588-3_20 | |||||||
| 出版者 | ||||||||
| 出版者 | Springer Verlag | |||||||
| 抄録 | ||||||||
| 内容記述タイプ | Abstract | |||||||
| 内容記述 | Since the first demonstration of true atomic-resolution imaging by frequency modulation atomic force microscopy (FM-AFM) in liquid, the method has been used for imaging subnanometer-scale structures of various materials including minerals, biological systems and other organic molecules. Rencetly, there have been further advancements in theFM-AFMinstrumentation. Three-dimensional (3D) force measurement techniques are proposed for visualizing 3D hydration structures formed at a solid-liquid interface. Thesemethods further enabled to visualize 3D distributions of flexible surface structures at interfaces between soft materials andwater. Furthermore, the fundamental performance such as force sensitivity and operation speed have been significantly improved using a small cantilever and high-speed phase detector. These technical advancements enabled direct visualization of atomic-scale interfacial phenomena at 1 frame/s. In this chapter, these recent advancements in the FM-AFM instrumentation and their applications to the studies on various interfacial phenomena are presented. © Springer International Publishing Switzerland 2015 | |||||||
| 著者版フラグ | ||||||||
| 出版タイプ | AM | |||||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||
