| Item type |
学術雑誌論文 / Journal Article(1) |
| 公開日 |
2017-10-03 |
| タイトル |
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|
タイトル |
Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope |
| 言語 |
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言語 |
eng |
| 資源タイプ |
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資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
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資源タイプ |
journal article |
| ID登録 |
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ID登録 |
10.24517/00010709 |
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ID登録タイプ |
JaLC |
| 著者 |
Fukuda, Shingo
Uchihashi, Takayuki
Ando, Toshio
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| 著者別表示 |
福田, 真悟
内橋, 貴之
安藤, 敏夫
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| 提供者所属 |
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内容記述タイプ |
Other |
|
内容記述 |
金沢大学ナノ生命科学研究所 |
| 書誌情報 |
Review of Scientific Instruments
巻 86,
号 6,
p. 063703,
発行日 2015-06-01
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| ISSN |
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収録物識別子タイプ |
ISSN |
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収録物識別子 |
0034-6748 |
| NCID |
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収録物識別子タイプ |
NCID |
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収録物識別子 |
AA00817730 |
| DOI |
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関連タイプ |
isIdenticalTo |
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識別子タイプ |
DOI |
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関連識別子 |
10.1063/1.4922381 |
| 出版者 |
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出版者 |
American Institute of Physics |
| 抄録 |
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内容記述タイプ |
Abstract |
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内容記述 |
In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanner's fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the α<inf>3</inf>β<inf>3</inf> subcomplex of F<inf>1</inf>-ATPase in dynamic action at ∼7 frames/s. © 2015 AIP Publishing LLC. |
| 著者版フラグ |
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出版タイプ |
VoR |
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出版タイプResource |
http://purl.org/coar/version/c_970fb48d4fbd8a85 |
SC-PR-UCHHASHI-T-063703.pdf (4.3 MB)
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