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  1. B. 理工学域; 数物科学類・物質化学類・機械工学類・フロンティア工学類・電子情報通信学類・地球社会基盤学類・生命理工学類
  2. b 10. 学術雑誌掲載論文
  3. 1.査読済論文(工)

Evaluation on current interruption ability of CO2 and SF6 using current and voltage application highly controlled by power semiconductors

http://hdl.handle.net/2297/45475
http://hdl.handle.net/2297/45475
9a71b802-39ec-405e-9d7a-1e33f3d74ff1
名前 / ファイル ライセンス アクション
TE-PR-TANAKA-Y-307.pdf TE-PR-TANAKA-Y-307.pdf (847.0 kB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2017-10-03
タイトル
タイトル Evaluation on current interruption ability of CO2 and SF6 using current and voltage application highly controlled by power semiconductors
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
著者 Nakano, Tomoyuki

× Nakano, Tomoyuki

WEKO 13729

Nakano, Tomoyuki

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Murai, Kosuke

× Murai, Kosuke

WEKO 13730

Murai, Kosuke

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Tanaka, Yasunori

× Tanaka, Yasunori

WEKO 67
e-Rad 90303263
金沢大学研究者情報 90303263
研究者番号 90303263

Tanaka, Yasunori

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Uesugi, Yoshihiko

× Uesugi, Yoshihiko

WEKO 50
e-Rad 90213339
金沢大学研究者情報 90213339
研究者番号 90213339

Uesugi, Yoshihiko

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Ishijima, Tatsuo

× Ishijima, Tatsuo

WEKO 12202
金沢大学研究者情報 00324450
研究者番号 00324450

Ishijima, Tatsuo

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Shiraishi, Tatsuro

× Shiraishi, Tatsuro

WEKO 13731

Shiraishi, Tatsuro

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Shimizu, Takahiro

× Shimizu, Takahiro

WEKO 13732

Shimizu, Takahiro

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Tomita, Kentaro

× Tomita, Kentaro

WEKO 13733

Tomita, Kentaro

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Suzuki, Katsumi

× Suzuki, Katsumi

WEKO 13734

Suzuki, Katsumi

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Shinka, Takeshi

× Shinka, Takeshi

WEKO 13735

Shinka, Takeshi

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書誌情報 2015 3rd International Conference on Electric Power Equipment - Switching Technology, ICEPE-ST 2015

号 7368391, p. 307-321, 発行日 2015-10-25
ISBN
識別子タイプ ISBN
関連識別子 978-146737414-9
DOI
関連タイプ isVersionOf
識別子タイプ DOI
関連識別子 10.1109/ICEPE-ST.2015.7368391
出版者
出版者 Institute of Electrical and Electronics Engineers Inc.
抄録
内容記述タイプ Abstract
内容記述 This paper reports a new simple test technique to evaluate current interruption ability of arc quenching gases. In the test, current and voltage applied to the arc was controlled using a insulated gate bipolar transistor (IGBT). Switching the IGBT enables us to produce free recovery conditions for a fundamental arc decay in nozzles. In addition to this, a voltage was intentionally applied to the free recovery arcs between the electrodes by switching-off IGBT again at the specified delay time td. This applied voltage is called quasi transient recovery voltage (quasi-TRV). We can evaluate successful interruption or interruption failure by measuring the current between the electrodes after quasi-TRV application. We compared the interruption ability of SF6 and CO2 through this developed technique. The experimental results show that a residual arc in SF6 gas flow decays four times more rapidly than that in CO2 gas flow. Influence of observation holes in the nozzles used in the experiments was also investigated, showing less influence of observation on the arc behavior. © 2015 IEEE.
権利
権利情報 Copyright © IEEE
著者版フラグ
出版タイプ AM
出版タイプResource http://purl.org/coar/version/c_ab4af688f83e57aa
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